The National Institute of Standards and Technology (NIST) is seeking commercial solutions for Field Programmable Array-based Memory Device Characterization Boards to support measurement needs in emerging neuromorphic hardware for artificial intelligence. The procurement requires the design and fabrication of a test platform that integrates a custom memory device, multi-channel ADCs, and DACs, centered around a Zynq System on Module (SOM) daughter card, with an emphasis on schematic and layout design, signal integrity analysis, and the use of USA-sourced materials. This initiative is crucial for advancing measurement capabilities in the field of artificial intelligence, and interested parties are encouraged to submit detailed responses outlining their qualifications and compliance with industry standards by emailing Jenna Bortner at jenna.bortner@nist.gov or Forest Crumpler at forest.crumpler@nist.gov. This notice serves primarily for market research purposes and does not imply a contract award.