The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for upgrades to a nano-differential mobility analyzer (nano-DMA) and a water-based condensation particle counter (w-CPC) to enhance semiconductor manufacturing capabilities. The objective is to develop a system that can accurately measure the size distribution and number density of sub-50 nm particles, which is critical for ensuring the purity of cleaning chemicals used in semiconductor manufacturing processes. This procurement is vital for advancing metrological capabilities in particle detection, which is essential for the production of next-generation semiconductor materials. Interested vendors should respond to the notice by contacting Jenna Bortner or Forest Crumpler via email, providing detailed information about their capabilities and products, with responses encouraged before the specified deadline.