Nano-scanning mobility particle sizer (nano-SMPS)
ID: NIST-SS25-CHIPS-0001Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/93b2c0b9a8984c67988904b5ced9c456/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources capable of providing a nano-scanning mobility particle sizer (nano-SMPS) system. This system is essential for enhancing semiconductor manufacturing yield by enabling the detection, identification, and quantification of sub-50 nm particles in cleaning chemicals, which is critical for the production of next-generation chips. The nano-SMPS will be utilized in a controlled laboratory environment to assess the efficiency of ultrafiltration systems and will require specific components such as an electrostatic classifier, charge neutralizer, differential mobility analyzer, and condensation particle counter. Interested parties should respond to the notice by contacting Jenna Bortner or Forest Crumpler via email, ensuring their submissions are complete and adhere to the outlined requirements, as this notice is for market research purposes and does not constitute a commitment to award a contract.

    Point(s) of Contact
    Jenna Bortner
    jenna.bortner@nist.gov
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    No associated files provided.
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    Title
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    Nano-scanning mobility particle sizer (nano-SMPS)
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