NOTICE OF INTENT TO SOLE SOURCE: High-Speed, Distributable Monte Carlo Simulation for SEM-based Overlay Metrology
ID: NB305000-25-00905Type: Special Notice
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Software Publishers (513210)

PSC

IT AND TELECOM - APPLICATION DEVELOPMENT SOFTWARE (PERPETUAL LICENSE SOFTWARE) (7A20)

Original Source

https://sam.gov/opp/d72c443488b34dcaa2ffea4a475e5958/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Special Notice regarding its intent to sole source a contract for High-Speed, Distributable Monte Carlo Simulation for Scanning Electron Microscope (SEM)-based Overlay Metrology. This procurement aims to acquire advanced software solutions that will enhance the precision and efficiency of overlay metrology processes, which are critical for semiconductor manufacturing and related applications. The software is expected to support the development of high-speed simulations that can be distributed across multiple computing environments, thereby improving measurement accuracy and throughput. Interested parties can reach out to Jenna Bortner at jenna.bortner@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further inquiries regarding this opportunity.

    Point(s) of Contact
    Jenna Bortner
    jenna.bortner@nist.gov
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    No associated files provided.
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