Sources Sought Notice for EUV Reflectometer for SURF III
ID: NIST-FY25-CHIPS-0070Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals (334515)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/24298af6b4824c469c9ad911d3e28abb/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for an EUV Reflectometer intended for use in laboratory settings at their facility in Gaithersburg, Maryland. This procurement aims to acquire advanced measurement instruments that will enhance precision in scientific research, focusing on specific sample orientations and detector functionalities as outlined in the associated schematic figures. The reflectometer will play a crucial role in capturing data essential for various experimental needs, emphasizing the importance of detailed engineering specifications. Interested vendors can reach out to Jenna Bortner at jenna.bortner@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further information regarding this opportunity.

    Point(s) of Contact
    Jenna Bortner
    jenna.bortner@nist.gov
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    Title
    Posted
    Reflectometer souces sought figures.pdf
    The document outlines a solicitation for a reflectometer aimed at capturing data in specific laboratory settings. It includes various schematic figures demonstrating the planned laboratory space, sample orientations (normal and grazing incidence), and the motion of a detector turret. The figures illustrate critical components of the equipment, such as the AXUV-100 scintillator and quadrant detector, which are essential for their operational capabilities. This solicitation appears to be part of broader governmental Requests for Proposals (RFPs) and grants, likely intended to enhance measurement precision in scientific research, emphasizing the need for advanced instruments. The focus on specific sample positioning and detector functionality suggests a specialized project requiring detailed engineering specifications to meet experimental needs. The document serves as a foundational request for proposals that would support the acquisition of technology to advance laboratory capabilities in the relevant field.
    Lifecycle
    Title
    Type
    Sources Sought Notice for EUV Reflectometer for SURF III
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