ARC3 Controller with nanoTDDB accessory
ID: NIST-SS25-CHIPS-0048Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/67e64a133df848e09f2a35b2ec004971/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is seeking sources for the procurement of an ARC3 Controller with a nanoTDDB accessory to enhance their existing atomic force microscope capabilities. The primary objective is to acquire a control unit that is compatible with their current MFP-3D atomic force microscope and can perform nanoscale measurements critical for the CHIPS program, focusing on the breakdown characterization of wide bandgap semiconductor materials. This equipment is vital for precision measurements in various advanced fields, including nanotechnology and quantum photonics. Interested vendors must respond by providing their capabilities and relevant information to Junee Johnson at junee.johnson@nist.gov, with responses encouraged before the deadline of November 18, 2024. The procurement is not a request for quotations, and no contract will be awarded as a result of this notice.

    Point(s) of Contact
    Junee Johnson
    junee.johnson@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    ARC3 Controller with nanoTDDB accessory
    Currently viewing
    Sources Sought
    Similar Opportunities
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Motorized Positioners
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought notice for the procurement of motorized positioners to enhance their wafer probing systems. The specific requirements include two motorized linear translation stages: one horizontal with a travel range of at least 75 mm and a minimum incremental movement of 20 nm, and one vertical with a travel range of at least 20 mm, also with a minimum incremental movement of 20 nm. These positioners are critical for characterizing high-frequency microelectronic devices under the CHIPS Act program, supporting advancements in semiconductor technology. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 12, 2025. This notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    CHIPS R&D Electrical/thermal TEM holder – Combined Sources Sought/Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a specialized electrical/thermal transmission electron microscope (TEM) holder system and compatible microelectromechanical system (MEMS)-based chips for advanced semiconductor research. This procurement aims to enhance measurement capabilities critical for evaluating the readiness of next-generation semiconductors by detecting early-stage indicators of material degradation and device failure under operational conditions. The TEM holder and associated equipment will support NIST's mission to improve manufacturing processes and assess advanced materials in semiconductor production, particularly focusing on two-dimensional and wide bandgap semiconductors. Interested vendors should respond with their capabilities and relevant information to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Notice of Intent to Noncompetitively Acquire CHIPS R&D On-axis TEM tomography Holder
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire an on-axis transmission electron microscopy (TEM) tomography holder to support its CHIPS atom probe tomography project in Boulder, Colorado. This specialized equipment is crucial for analyzing wire-based specimens used in the CAMECA Invizo 6000 atom probe microscope, which plays a significant role in the characterization of materials relevant to semiconductor manufacturing. The acquisition is based on market research indicating that Fischione Instruments is the only vendor capable of providing a compatible holder that meets NIST's stringent requirements. Interested parties who believe they can fulfill these requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Forest Crumpler at forest.crumpler@nist.gov with relevant information by the specified response date.
    Combined Sources Sought/Notice of Intent to Sole Source: Sub-THz VNA Extenders and Amplifier
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire Sub-THz VNA extenders and a high-power amplifier to support its CHIPS program focused on high-frequency transistor characterization. The procurement includes specific requirements for WR6.5, WR5.1, and WR3.4 VNA waveguide extenders, as well as a D-band waveguide amplifier, all of which are critical for developing a unique microelectronic measurement setup essential for semiconductor testing. This equipment is vital for enhancing measurement capabilities and accelerating the development of next-generation microelectronic devices. Interested vendors must respond by December 23, 2025, with their capabilities and relevant information to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Commercial semi-automatic probe stations
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought notice for the procurement of a commercial semi-automatic probe station. This equipment is essential for conducting reliability testing on silicon carbide field effect transistors (FETs), which are increasingly used in high power semiconductor applications across various industries, including electric vehicles and energy storage. The probe station must meet specific technical requirements, including the capability to probe 300 mm wafers, accommodate both whole wafers and pre-diced dies, and include features such as a heated wafer chuck and a digital microscope. Interested vendors should submit their responses, including company information and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline of December 12, 2025, for any questions regarding this notice.
    Interferometry Laser - Combined Sources Sought Notice and Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice for a tunable laser, specifically a 780 nm laser, as part of its CHIPS R&D Program. The laser is required for mass sensing experiments related to atomic layer deposition processes critical in semiconductor manufacturing, aiming to enhance measurement capabilities and optimize fabrication yields. NIST intends to issue a sole source award to Toptica Photonics Inc if no other capable sources are identified, with responses due to the primary contact, Nina Lin, at nina.lin@nist.gov. This procurement is essential for meeting project milestones by early FY26, and interested parties are encouraged to respond with detailed capabilities and specifications.