The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire an on-axis transmission electron microscopy (TEM) tomography holder to support its CHIPS atom probe tomography project in Boulder, Colorado. This specialized equipment is crucial for analyzing wire-based specimens used in the CAMECA Invizo 6000 atom probe microscope, which plays a significant role in the characterization of materials relevant to semiconductor manufacturing. The acquisition is based on market research indicating that Fischione Instruments is the only vendor capable of providing a compatible holder that meets NIST's stringent requirements. Interested parties who believe they can fulfill these requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Forest Crumpler at forest.crumpler@nist.gov with relevant information by the specified response date.