Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
ID: NIST-SS26-CHIPS-52Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/cc25b880dc0d4e118ccfc16110da98f8/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.

    Point(s) of Contact
    Tracy Retterer
    Tracy.retterer@nist.gov
    Donald Collie
    donald.collie@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Currently viewing
    Sources Sought
    Similar Opportunities
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Interferometry Laser - Combined Sources Sought Notice and Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice for a tunable laser, specifically a 780 nm laser, as part of its CHIPS R&D Program. The laser is required for mass sensing experiments related to atomic layer deposition processes critical in semiconductor manufacturing, aiming to enhance measurement capabilities and optimize fabrication yields. NIST intends to issue a sole source award to Toptica Photonics Inc if no other capable sources are identified, with responses due to the primary contact, Nina Lin, at nina.lin@nist.gov. This procurement is essential for meeting project milestones by early FY26, and interested parties are encouraged to respond with detailed capabilities and specifications.
    Ultraviolet Pulsed Laser Head
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources for an ultraviolet 266-nm pulsed laser head compatible with its existing time-resolved photoluminescence system. The procurement aims to replace visible laser heads with a 266 nm pulsed laser for characterizing wide bandgap semiconductor materials such as GaN or SiC, requiring specific performance capabilities including picosecond pulses and an average power of at least 1 mW at a repetition frequency of 80 MHz. Interested vendors must submit detailed information about their products, including specifications, customization options, and service offerings, by emailing the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov. This sources sought notice is for market research purposes only and does not constitute a commitment to issue a solicitation or award a contract.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.
    Sources Sought Notice for a MIR Camera
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice (NIST-SS26-CHIPS-23) to identify potential sources for a mid-infrared camera and associated lenses. This equipment is critical for the Digital Twins for Atomic Layer Deposition Processes Project, which aims to develop and validate digital twin models for atomic layer deposition processes, requiring high sensitivity and rapid imaging capabilities across the mid-infrared spectral region. Interested vendors are requested to provide detailed company information, product specifications, customization capabilities, and pricing by December 15, 2025, to assist in market research for this procurement. For further inquiries, respondents may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Sources Sought Notice for Coupled Device Detector Camera System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding a Coupled Device Detector Camera System through a sources sought notice (NIST-SS26-CHIPS-25). This procurement aims to support the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project, which focuses on enhancing plasma etching efficiencies via in situ optical diagnostics. The required system includes an intensified electron multiplication charge coupled device (IEMCCD) camera with specific technical specifications, including ultra-low noise, high gain, and fast optical emission spectroscopy capabilities. Interested parties should provide detailed company information, product specifications, and performance capabilities, and may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.