Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics

The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.