Optical Microscope

The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.