CHIPS R&D Electrical/thermal TEM holder – Combined Sources Sought/Notice of Intent to Sole Source
ID: NIST-SS26-CHIPS-51Type: Special Notice
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Other Electronic Component Manufacturing (334419)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/4c5b7ec6746543ac99f47120546f6fca/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a specialized electrical/thermal transmission electron microscope (TEM) holder system and compatible microelectromechanical system (MEMS)-based chips for advanced semiconductor research. This procurement aims to enhance measurement capabilities critical for evaluating the readiness of next-generation semiconductors by detecting early-stage indicators of material degradation and device failure under operational conditions. The TEM holder and associated equipment will support NIST's mission to improve manufacturing processes and assess advanced materials in semiconductor production, particularly focusing on two-dimensional and wide bandgap semiconductors. Interested vendors should respond with their capabilities and relevant information to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.

    Point(s) of Contact
    Tracy Retterer
    Tracy.retterer@nist.gov
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    No associated files provided.
    Similar Opportunities
    Notice of Intent to Noncompetitively Acquire CHIPS R&D On-axis TEM tomography Holder
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire an on-axis transmission electron microscopy (TEM) tomography holder to support its CHIPS atom probe tomography project in Boulder, Colorado. This specialized equipment is crucial for analyzing wire-based specimens used in the CAMECA Invizo 6000 atom probe microscope, which plays a significant role in the characterization of materials relevant to semiconductor manufacturing. The acquisition is based on market research indicating that Fischione Instruments is the only vendor capable of providing a compatible holder that meets NIST's stringent requirements. Interested parties who believe they can fulfill these requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Forest Crumpler at forest.crumpler@nist.gov with relevant information by the specified response date.
    Electrochemical Liquid TEM Holder System with Heating/Cooling - Combined Sources Sought Notice and Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking to procure an Electrochemical Liquid TEM Holder System with Heating/Cooling through a combined sources sought notice and notice of intent to sole source. This acquisition is part of the CHIPS R&D Metrology Grant Challenge Project 7.03, aimed at developing thermodynamic datasets and measurement platforms for critical material recovery from microelectronic waste. The system must be compatible with Thermo Fisher Scientific TEMs and X-ray scattering beamlines, featuring integrated electrochemical and temperature control capabilities, along with specific design requirements and comprehensive support services. Interested vendors should contact Nina Lin at nina.lin@nist.gov or Donald Collie at donald.collie@nist.gov for further details, as market research has indicated that Protochips, Inc. is the only capable source for this procurement.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Commercial semi-automatic probe stations
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought notice for the procurement of a commercial semi-automatic probe station. This equipment is essential for conducting reliability testing on silicon carbide field effect transistors (FETs), which are increasingly used in high power semiconductor applications across various industries, including electric vehicles and energy storage. The probe station must meet specific technical requirements, including the capability to probe 300 mm wafers, accommodate both whole wafers and pre-diced dies, and include features such as a heated wafer chuck and a digital microscope. Interested vendors should submit their responses, including company information and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline of December 12, 2025, for any questions regarding this notice.
    CHIPS R&D: Extreme Thermal Cycling Chamber– Combined Sources Sought/Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking to procure an Extreme Thermal Cycling Chamber to support its CHIPS Metrology program, which focuses on the reliability of materials used in advanced semiconductor packaging. The chamber must meet specific technical requirements, including a temperature range of -100 °C to 200 °C and a cycling rate of at least 70 °C/min, to facilitate accelerated aging experiments on polymeric components. This procurement is critical for enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, and interested vendors are encouraged to respond with their capabilities and relevant information to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.
    Motorized Positioners
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought notice for the procurement of motorized positioners to enhance their wafer probing systems. The specific requirements include two motorized linear translation stages: one horizontal with a travel range of at least 75 mm and a minimum incremental movement of 20 nm, and one vertical with a travel range of at least 20 mm, also with a minimum incremental movement of 20 nm. These positioners are critical for characterizing high-frequency microelectronic devices under the CHIPS Act program, supporting advancements in semiconductor technology. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 12, 2025. This notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    Sole Source Justification Field Emission Scanning Electron Microscope (FESEM)
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Sole Source Field Emission Scanning Electron Microscope (FESEM) through a Justification for Other Than Full and Open Competition (JOFOC). This procurement is essential for advancing NIST's capabilities in laboratory equipment and supplies, particularly in high-resolution imaging and analysis. The justification for this sole source acquisition will be publicly available within 14 days of the contract award, and the opportunity will remain open for 30 days in accordance with federal regulations. Interested parties can reach out to Nina Lin at nina.lin@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further inquiries.