Mobile Manipulator System
ID: AMDTCSSN2501464Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/c45fa699e6704ddab6463143dba76945/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources for a Mobile Manipulator System to support its research and development of quantitative standard test methods for mobile manipulators in manufacturing environments. The procurement aims to acquire an advanced, integrated mobile manipulator capable of operating in both indoor and outdoor settings, which will facilitate the development of performance metrics and standardized test methods essential for benchmarking robotic capabilities. This initiative is critical for maintaining global competitiveness and advancing the field of robotics, with a focus on enhancing communication with stakeholders through hands-on demonstrations. Interested parties should respond to the primary contact, Hunter Tjugum, at hunter.tjugum@nist.gov by email, providing detailed information about their capabilities and products by the specified deadline, ideally within 14 business days of the notice issuance.

    Point(s) of Contact
    Hunter Tjugum
    (303) 497-3663
    hunter.tjugum@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Mobile Manipulator System
    Currently viewing
    Sources Sought
    Similar Opportunities
    Motorized Positioners
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought notice for the procurement of motorized positioners to enhance their wafer probing systems. The specific requirements include two motorized linear translation stages: one horizontal with a travel range of at least 75 mm and a minimum incremental movement of 20 nm, and one vertical with a travel range of at least 20 mm, also with a minimum incremental movement of 20 nm. These positioners are critical for characterizing high-frequency microelectronic devices under the CHIPS Act program, supporting advancements in semiconductor technology. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 12, 2025. This notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Humanoid Robot for AI Development & Real-World Applications
    Energy, Department Of
    The Department of Energy, through Argonne National Laboratory, is seeking quotations for a humanoid mobile robot system designed for AI development and real-world applications. The robot must feature a human-like torso, dual arms with a minimum payload capacity of 3 kg per arm, and an omnidirectional mobile base equipped with LiDAR for autonomous navigation, along with specific software capabilities including VR teleoperation and ROS2 compatibility. This procurement is critical for advancing research in robotics and AI, emphasizing the need for non-Chinese manufactured products and open-source hardware to facilitate customization. Interested vendors must submit their completed ANL-70 Request for Quotation, along with the ANL-70B Representations and Certifications, by December 17, 2025, at 12:00 noon CDT, and can contact Luke Oprondek at loprondek@anl.gov for further information.
    Sources Sought Notice for a MIR Camera
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice (NIST-SS26-CHIPS-23) to identify potential sources for a mid-infrared camera and associated lenses. This equipment is critical for the Digital Twins for Atomic Layer Deposition Processes Project, which aims to develop and validate digital twin models for atomic layer deposition processes, requiring high sensitivity and rapid imaging capabilities across the mid-infrared spectral region. Interested vendors are requested to provide detailed company information, product specifications, customization capabilities, and pricing by December 15, 2025, to assist in market research for this procurement. For further inquiries, respondents may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov.
    Sources Sought Notice for two (2) CMOS Cameras
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking potential sources for two scientific CMOS cameras through a sources sought notice (NIST-SS26-CHIPS-24). These cameras are integral to the Digital Twins for Atomic Layer Deposition Processes Project, aimed at developing and validating digital twin models for atomic layer deposition processes by enabling high-sensitivity and high-speed absorption tomographic measurements. Key technical specifications include a back-illuminated scientific CMOS sensor, high quantum efficiency, global shutter capability, and a minimum frame readout rate of 100 frames per second. Interested vendors should submit their responses, including company information and product details, by December 15, 2025, to Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov, with submissions not exceeding 20 pages.
    High-Performance 3D Digital Image Correlation (DIC) System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information on potential sources for a High-Performance 3D Digital Image Correlation (DIC) System. This system is intended for precise, in-situ measurement of displacement and strain under various thermal and mechanical loading conditions, which is crucial for developing advanced testing methodologies and accurate failure prediction models in electronic packaging. The DIC system will play a vital role in addressing new failure mechanisms in 3D integrated devices, supporting the CHIPS Metrology program's objectives. Interested parties should contact Nina Lin at nina.lin@nist.gov for further details, and responses to this sources sought notice should be submitted promptly, as there is no solicitation available at this time.
    Custom Magneto-resistive Sensors
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought Notice for the fabrication of custom magneto-resistive sensors. These sensors are intended for use in a scanning magnetic microscope being developed for the CHIPS Metrology Project, specifically for acquiring 3D thermal images in semiconductor packages. The procurement requires sensors that meet specific technical specifications, including a frequency range from DC to 100 kHz, field sensitivity parameters, and operational conditions, with a minimum delivery of 100 sensors. Interested parties should respond to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, with their capabilities and relevant experience by the deadline of December 12, 2025, for any questions regarding the notice.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.