Sources Sought Notice for Volumetric Cementitious Mix-Pump System for Additive Construction
ID: 1333ND-25-00964Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

Original Source

https://sam.gov/opp/c8ce970bf428436ca03ae3b6fba90532/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for a Volumetric Cementitious Mix-Pump System intended for its Additive Manufacturing with Cement-based Materials project. This procurement aims to enhance NIST's infrastructure by acquiring a mix-pump system that integrates with existing equipment, thereby improving printing capacity, accuracy, and continuous material feeding. The required system must be compatible with a seven-axis robot mortar printer and existing sensors, featuring monitoring capabilities for temperature, pressure, and material sensing, while ensuring compliance with safety regulations. Interested contractors should submit information regarding their products and capabilities to Marvin Jean at marvin.jean@nist.gov, noting that there is no obligation for the government to issue a contract based on this notice.

    Point(s) of Contact
    Marvin Jean
    marvin.jean@nist.gov
    Files
    Title
    Posted
    Sources Sought Notice.pdf
    The National Institute of Standards and Technology (NIST) issued a Sources Sought Notice for a Volumetric Cementitious Mix-Pump System intended for use in its Additive Manufacturing with Cement-based Materials project. This acquisition aims to enhance NIST's existing infrastructure capabilities by procuring a mix-pump system that integrates seamlessly with current equipment, allowing for increased printing capacity, accuracy, and continuous material feeding. Specifications for the required mix-pump system include compatibility with a seven-axis robot mortar printer and existing sensors, along with features such as monitoring for temperature, pressure, and material sensing. The notice details the need for new, unrefurbished equipment, emphasizing the importance of documented compliance with safety regulations. Interested contractors are invited to respond with information about their products, capabilities, and relevant company details while ensuring the confidentiality of proprietary information. Responses must be thorough yet concise, providing insight into the contractor's experience with similar equipment. The solicitation underscores that there is no obligation for the government to issue a contract based on this notice, laying the groundwork for future procurement processes and emphasizing the need for qualified vendor participation.
    Similar Opportunities
    Sources Sought Notice for Microfluidics Control Station
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a sources sought notice to identify potential sources for a pressure-based flow control system. This system is essential for high precision flow-based measurements in microscale measurement technology, aimed at detecting and classifying critical minerals in semiconductor manufacturing waste streams. The procurement is aligned with the CHIPS R&D Metrology Project and requires specific technical capabilities, including pressure control modules, flow sensors, microvalves, and compatible software for operation with Matlab and Python. Interested vendors should submit their responses, including company details and product specifications, to the primary contact, Nina Lin, at nina.lin@nist.gov, as soon as possible, with no solicitation currently available.
    Robotic Arms
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of robotic arms and associated equipment. The requirement includes four collaborative robotic arms with a 600 mm reach, a mountable smart camera, various grippers, and a professional license for RoboDK software, all intended for use in manufacturing complex permittivity standards up to 330 GHz. This initiative supports the NIST CHIPS program, which aims to enhance measurement practices and algorithms for complex permittivity and on-wafer measurements. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 17, 2025. Please note that this notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    High-Performance 3D Digital Image Correlation (DIC) System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information on potential sources for a High-Performance 3D Digital Image Correlation (DIC) System. This system is intended for precise, in-situ measurement of displacement and strain under various thermal and mechanical loading conditions, which is crucial for developing advanced testing methodologies and accurate failure prediction models in electronic packaging. The DIC system will play a vital role in addressing new failure mechanisms in 3D integrated devices, supporting the CHIPS Metrology program's objectives. Interested parties should contact Nina Lin at nina.lin@nist.gov for further details, and responses to this sources sought notice should be submitted promptly, as there is no solicitation available at this time.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.
    CHIPS R&D: Extreme Thermal Cycling Chamber– Combined Sources Sought/Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking to procure an Extreme Thermal Cycling Chamber to support its CHIPS Metrology program, which focuses on the reliability of materials used in advanced semiconductor packaging. The chamber must meet specific technical requirements, including a temperature range of -100 °C to 200 °C and a cycling rate of at least 70 °C/min, to facilitate accelerated aging experiments on polymeric components. This procurement is critical for enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, and interested vendors are encouraged to respond with their capabilities and relevant information to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Motorized Positioners
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought notice for the procurement of motorized positioners to enhance their wafer probing systems. The specific requirements include two motorized linear translation stages: one horizontal with a travel range of at least 75 mm and a minimum incremental movement of 20 nm, and one vertical with a travel range of at least 20 mm, also with a minimum incremental movement of 20 nm. These positioners are critical for characterizing high-frequency microelectronic devices under the CHIPS Act program, supporting advancements in semiconductor technology. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 12, 2025. This notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    Electrochemical Liquid TEM Holder System with Heating/Cooling - Combined Sources Sought Notice and Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking to procure an Electrochemical Liquid TEM Holder System with Heating/Cooling through a combined sources sought notice and notice of intent to sole source. This acquisition is part of the CHIPS R&D Metrology Grant Challenge Project 7.03, aimed at developing thermodynamic datasets and measurement platforms for critical material recovery from microelectronic waste. The system must be compatible with Thermo Fisher Scientific TEMs and X-ray scattering beamlines, featuring integrated electrochemical and temperature control capabilities, along with specific design requirements and comprehensive support services. Interested vendors should contact Nina Lin at nina.lin@nist.gov or Donald Collie at donald.collie@nist.gov for further details, as market research has indicated that Protochips, Inc. is the only capable source for this procurement.
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.