Sources Sought Notice for Microfluidics Control Station
ID: NIST-SS26-CHIPS-32Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Set Aside

No Set aside used (NONE)
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a sources sought notice to identify potential sources for a pressure-based flow control system. This system is essential for high precision flow-based measurements in microscale measurement technology, aimed at detecting and classifying critical minerals in semiconductor manufacturing waste streams. The procurement is aligned with the CHIPS R&D Metrology Project and requires specific technical capabilities, including pressure control modules, flow sensors, microvalves, and compatible software for operation with Matlab and Python. Interested vendors should submit their responses, including company details and product specifications, to the primary contact, Nina Lin, at nina.lin@nist.gov, as soon as possible, with no solicitation currently available.

    Point(s) of Contact
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Similar Opportunities
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.
    Electrochemical Liquid TEM Holder System with Heating/Cooling - Combined Sources Sought Notice and Notice of Intent to Sole Source
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking to procure an Electrochemical Liquid TEM Holder System with Heating/Cooling through a combined sources sought notice and notice of intent to sole source. This acquisition is part of the CHIPS R&D Metrology Grant Challenge Project 7.03, aimed at developing thermodynamic datasets and measurement platforms for critical material recovery from microelectronic waste. The system must be compatible with Thermo Fisher Scientific TEMs and X-ray scattering beamlines, featuring integrated electrochemical and temperature control capabilities, along with specific design requirements and comprehensive support services. Interested vendors should contact Nina Lin at nina.lin@nist.gov or Donald Collie at donald.collie@nist.gov for further details, as market research has indicated that Protochips, Inc. is the only capable source for this procurement.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Custom Magneto-resistive Sensors
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought Notice for the fabrication of custom magneto-resistive sensors. These sensors are intended for use in a scanning magnetic microscope being developed for the CHIPS Metrology Project, specifically for acquiring 3D thermal images in semiconductor packages. The procurement requires sensors that meet specific technical specifications, including a frequency range from DC to 100 kHz, field sensitivity parameters, and operational conditions, with a minimum delivery of 100 sensors. Interested parties should respond to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, with their capabilities and relevant experience by the deadline of December 12, 2025, for any questions regarding the notice.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Environmental test chamber
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding the procurement of an Environmental Test Chamber and a Water Recirculation System as part of a Sources Sought Notice (NIST-SS26-CHIPS-29). The Environmental Test Chamber must meet specific requirements, including a workspace of over 1.5 cubic feet, a temperature range of -35°C to +175°C, and humidity control between 10%-95% RH, among other technical specifications, to support metrology research for semiconductor device manufacturing. This procurement is crucial for evaluating materials used in semiconductor devices, thereby enhancing device reliability and performance. Interested parties should submit their responses, including company information and product specifications, to Junee Johnson at junee.johnson@nist.gov, as this notice is for market research purposes and no solicitation is currently available.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.