Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
ID: NIST-SS26-CHIPS-31Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Set Aside

No Set aside used (NONE)

Original Source

https://sam.gov/workspace/contract/opp/21bc681db92b42aa9d5752e04376a32d/view
Timeline
    Description

    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.

    Point(s) of Contact
    Nina Lin
    nina.lin@nist.gov
    Tracy Retterer
    Tracy.retterer@nist.gov
    Files
    No associated files provided.
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