Autoradiography Scanner
ID: NIST-MML-25-SS10Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

Original Source

https://sam.gov/opp/73c2d4ba6b694680b67e1530343cb3a4/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is seeking information from potential suppliers for an Autoradiography Scanner, as part of a Sources Sought Notice. The scanner must meet specific technical requirements, including a minimum scanning area of 25cm by 25cm, a pixel size of 10 micrometers, and at least 16-bit depth, with a Windows PC interface for operation. This equipment is crucial for capturing ionizing radiation images, which are essential in various analytical applications. Interested parties are encouraged to submit their capabilities and relevant information to Don Graham at deg@nist.gov by the specified response date, with a competitive procurement anticipated in the third quarter of FY2025 and contract award by the fourth quarter of FY2025.

    Point(s) of Contact
    Don Graham
    (301) 975-8567
    deg@NIST.GOV
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Autoradiography Scanner
    Currently viewing
    Sources Sought
    Similar Opportunities
    High-Performance 3D Digital Image Correlation (DIC) System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information on potential sources for a High-Performance 3D Digital Image Correlation (DIC) System. This system is intended for precise, in-situ measurement of displacement and strain under various thermal and mechanical loading conditions, which is crucial for developing advanced testing methodologies and accurate failure prediction models in electronic packaging. The DIC system will play a vital role in addressing new failure mechanisms in 3D integrated devices, supporting the CHIPS Metrology program's objectives. Interested parties should contact Nina Lin at nina.lin@nist.gov for further details, and responses to this sources sought notice should be submitted promptly, as there is no solicitation available at this time.
    Optical Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Digital Slide Scanner System
    Health And Human Services, Department Of
    The Department of Health and Human Services, specifically the Food and Drug Administration (FDA), is seeking to acquire a Digital Slide Scanner System for the National Center for Toxicological Research (NCTR) to replace outdated equipment in its Pathology Lab. The new scanner must be capable of scanning at 20X and 40X magnifications, support brightfield and fluorescent imaging, and include features such as barcode scanning, z-stack capability, and image analysis software, while ensuring compliance with FedRAMP and FISMA standards. This system is crucial for creating digital copies of glass slides for research sharing and publications, as well as for providing quantitative data analysis. Interested vendors should note that responses are due by December 18, 2025, and can contact David Kramer at david.kramer@fda.hhs.gov or Nick Sartain at nick.sartain@fda.hhs.gov for further information.
    Notice of Intent to Sole Source for Coupled Device Detector Camera System
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is issuing a Notice of Intent to Sole Source for a coupled device detector camera system, intending to award the contract to Teledyne Digital Imaging. This procurement aims to acquire a specialized camera system capable of performing fast optical emission spectroscopy (OES) measurements, which are critical for improving efficiencies in plasma etching processes as part of the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics project. The camera must meet stringent technical specifications, including ultra-low noise characteristics and high gain, along with accompanying control and data analysis software. Interested vendors are encouraged to respond with their capabilities and relevant product information by contacting Elizabeth Timberlake or Donald Collie before the specified deadline, with no solicitation currently available.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Custom Magneto-resistive Sensors
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought Notice for the fabrication of custom magneto-resistive sensors. These sensors are intended for use in a scanning magnetic microscope being developed for the CHIPS Metrology Project, specifically for acquiring 3D thermal images in semiconductor packages. The procurement requires sensors that meet specific technical specifications, including a frequency range from DC to 100 kHz, field sensitivity parameters, and operational conditions, with a minimum delivery of 100 sensors. Interested parties should respond to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, with their capabilities and relevant experience by the deadline of December 12, 2025, for any questions regarding the notice.
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.
    Sources Sought Notice for CHIPS R&D Data Acquisition System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a Data Acquisition System (DAQ) to support its CHIPS Metrology program. This procurement aims to identify potential sources capable of providing a DAQ system that can measure resistance and temperature changes in advanced packaging materials during accelerated aging experiments, which are critical for assessing the long-term reliability of semiconductor chips. The DAQ system will play a vital role in enhancing metrology capabilities within the U.S. semiconductor manufacturing ecosystem, ultimately contributing to improved design efficiency and cost savings. Interested manufacturers should respond with detailed information about their products and capabilities to the primary contact, Tracy Retterer, at tracy.retterer@nist.gov, by the specified deadline.
    Commercial semi-automatic probe stations
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of a commercial semi-automatic probe station. This equipment is essential for conducting reliability testing on silicon carbide field effect transistors (FETs), which are increasingly used in high-power semiconductor applications across various industries, including electric vehicles and energy storage. The probe station must meet specific technical requirements, including the capability to probe 300 mm wafers, accommodate small pad sizes, and include features such as a heated wafer chuck and a digital microscope. Interested vendors should submit their responses, including company details and relevant experience, to Cielo Ibarra at cielo.ibarra@nist.gov by December 12, 2025, for consideration in NIST's market research efforts.
    Sole Source Justification Field Emission Scanning Electron Microscope (FESEM)
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Sole Source Field Emission Scanning Electron Microscope (FESEM) through a Justification for Other Than Full and Open Competition (JOFOC). This procurement is essential for advancing NIST's capabilities in laboratory equipment and supplies, particularly in high-resolution imaging and analysis. The justification for this sole source acquisition will be publicly available within 14 days of the contract award, and the opportunity will remain open for 30 days in accordance with federal regulations. Interested parties can reach out to Nina Lin at nina.lin@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further inquiries.