Motorized light microscope for an automated material analysis system
ID: NIST-MML-25-SS16Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

Original Source

https://sam.gov/opp/5a7344ca550546fd85e5eed42417122a/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is seeking information from potential suppliers for a motorized light microscope intended for an automated material analysis system. The procurement aims to acquire a fully motorized light microscope that meets specific technical specifications, including capabilities for transmitted, reflected, and polarized microscopy, a minimum stage scan range, and integration with existing Zeiss light microscopes. This equipment is crucial for advancing material analysis capabilities within NIST's research framework. Interested vendors are encouraged to submit their capabilities and relevant information by emailing Don Graham at deg@NIST.GOV, with responses due by the specified deadline, as NIST anticipates issuing a Request for Quotation in the third quarter of FY2025 and awarding a contract by the fourth quarter of FY2025.

    Point(s) of Contact
    Don Graham
    (301) 975-8567
    deg@NIST.GOV
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Motorized light microscope for an automated material analysis system
    Currently viewing
    Sources Sought
    Similar Opportunities
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Motorized Positioners
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought notice for the procurement of motorized positioners to enhance their wafer probing systems. The specific requirements include two motorized linear translation stages: one horizontal with a travel range of at least 75 mm and a minimum incremental movement of 20 nm, and one vertical with a travel range of at least 20 mm, also with a minimum incremental movement of 20 nm. These positioners are critical for characterizing high-frequency microelectronic devices under the CHIPS Act program, supporting advancements in semiconductor technology. Interested vendors should submit their responses, including company details and capabilities, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, by the deadline for questions on December 12, 2025. This notice is for market research purposes only and does not constitute a request for proposals or a commitment to award a contract.
    High-Performance 3D Digital Image Correlation (DIC) System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information on potential sources for a High-Performance 3D Digital Image Correlation (DIC) System. This system is intended for precise, in-situ measurement of displacement and strain under various thermal and mechanical loading conditions, which is crucial for developing advanced testing methodologies and accurate failure prediction models in electronic packaging. The DIC system will play a vital role in addressing new failure mechanisms in 3D integrated devices, supporting the CHIPS Metrology program's objectives. Interested parties should contact Nina Lin at nina.lin@nist.gov for further details, and responses to this sources sought notice should be submitted promptly, as there is no solicitation available at this time.
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Sole Source Justification Field Emission Scanning Electron Microscope (FESEM)
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Sole Source Field Emission Scanning Electron Microscope (FESEM) through a Justification for Other Than Full and Open Competition (JOFOC). This procurement is essential for advancing NIST's capabilities in laboratory equipment and supplies, particularly in high-resolution imaging and analysis. The justification for this sole source acquisition will be publicly available within 14 days of the contract award, and the opportunity will remain open for 30 days in accordance with federal regulations. Interested parties can reach out to Nina Lin at nina.lin@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further inquiries.
    Notice of Intent to Noncompetitively Acquire CHIPS R&D On-axis TEM tomography Holder
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire an on-axis transmission electron microscopy (TEM) tomography holder to support its CHIPS atom probe tomography project in Boulder, Colorado. This specialized equipment is crucial for analyzing wire-based specimens used in the CAMECA Invizo 6000 atom probe microscope, which plays a significant role in the characterization of materials relevant to semiconductor manufacturing. The acquisition is based on market research indicating that Fischione Instruments is the only vendor capable of providing a compatible holder that meets NIST's stringent requirements. Interested parties who believe they can fulfill these requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Forest Crumpler at forest.crumpler@nist.gov with relevant information by the specified response date.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.
    Sources Sought Notice for CHIPS R&D Optical frequency comb, Control electronics
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a Sources Sought Notice to identify potential sources for a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Ultrastable Laser System as part of its CHIPS Metrology Program. The objective is to enhance measurement science critical to semiconductor manufacturing processes, particularly in plasma etching, by acquiring advanced optical frequency comb diagnostics. This procurement is vital for improving the correlation between reactor inputs and etching outcomes, thereby facilitating the development of next-generation plasma etching processes. Interested manufacturers are encouraged to submit their capabilities and relevant product information to Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov, with responses preferred before the closing date, as this notice is for market research purposes only and does not guarantee a contract award.
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.