CHIPS R&D: Upgrade of In-Line RSoXS through station – Combined Sources Sought/Notice of Intent to Sole Source
ID: NIST-SS26-CHIPS-15Type: Special Notice
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables (334513)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/4dbea0544ba5414fbc953816ccfdb5eb/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to upgrade the resonant soft X-ray scattering (RSoXS) through station at the National Synchrotron Light Source II (NSLS-II) as part of the CHIPS Metrology program. The upgrade aims to enhance the station's capabilities for measuring microstructures and local chemistry in various soft matter systems, including those used in photolithography and organic electronics, by incorporating soft X-ray reflectivity and resonant critical dimension small angle scattering (res-CDSAXS). The project is intended to improve the throughput and efficiency of the RSoXS station, which is vital for advancing materials characterization in scientific research. Interested parties are encouraged to respond to this notice by contacting Tracy Retterer or Donald Collie via email, providing relevant company information and capabilities, with responses due as soon as possible.

    Point(s) of Contact
    Tracy Retterer
    Tracy.retterer@nist.gov
    Donald Collie
    donald.collie@nist.gov
    Files
    No associated files provided.
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