Sources Sought Notice for CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates
ID: NIST-SS26-CHIPS-14Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Semiconductor and Related Device Manufacturing (334413)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/29f41d4a1c824c85b4b9e999ffa498e0/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice to identify potential sources for a high-throughput high-resolution X-ray laminography/tomography system aimed at advancing semiconductor device manufacturing. The system is required to provide non-destructive three-dimensional imaging with specific performance criteria, including a resolution of 1 µm and a scan speed of at least 0.5 mm³/min, to support critical metrology gaps in the semiconductor ecosystem. This procurement is vital for enhancing metrology capabilities within the CHIPS Metrology program, which collaborates with various stakeholders in the semiconductor industry. Interested vendors should respond with detailed information about their capabilities and products by contacting Tracy Retterer or Donald Collie via email, as there is no solicitation available at this time, and responses are due as soon as possible.

    Point(s) of Contact
    Tracy Retterer
    Tracy.retterer@nist.gov
    Donald Collie
    donald.collie@nist.gov
    Files
    No associated files provided.
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