Sources Sought Notice for Xray Tomography Software
Contract Opportunity Analysis
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking potential sources for X-ray computed tomography (XCT) simulation software through a sources sought notice (NIST-SS26-CHIPS-26). This software is vital for the NIST CHIPS Metrology R&D program's nondestructive defect detection metrology project, which aims to enhance the accuracy and efficiency of semiconductor failure analysis by generating simulated data sets for XCT defect detection. Key requirements for the software include the ability to simulate various X-ray sources, utilize 3D surface meshes, simulate scattering effects, and output radiographs in standard image formats, among other capabilities. Interested parties must respond with detailed company information and product specifications by December 15, 2025, and can contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.