Solicitation for purchase of Semi-Automated Probe Station (CHIPS)
ID: 1333ND25QNB030150Type: Combined Synopsis/Solicitation
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Set Aside

Total Small Business Set-Aside (FAR 19.5) (SBA)

Original Source

https://sam.gov/opp/6d12aa5984ca4c6c9e7f313b0fa2d410/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking proposals from small businesses for the procurement of a semi-automated probe station to support research on silicon carbide field effect transistors (FETs). This equipment is essential for studying ultra-low gate leakage currents, which are critical for enhancing the reliability of high-power semiconductor applications. The probe station must accommodate 200 mm wafer sizes, ensure an ultra-dry environment to prevent moisture-related issues, and include installation and training for NIST staff. Proposals are due electronically by May 14, 2025, and must comply with the requirements outlined in the solicitation documents, including a firm-fixed-price quotation. Interested vendors can contact Forest Crumpler at forest.crumpler@nist.gov for further information.

    Point(s) of Contact
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    Title
    Posted
    1333ND25QNB030150.pdf
    The document is a Request for Quote (RFQ) for a Semi-Automated Probe Station issued by the National Institute of Standards and Technology (NIST). This solicitation follows simplified acquisition procedures and is designated for small businesses. The RFQ number is 1333ND25QNB030150, and proposals must be submitted electronically by May 9, 2025. Vendors are required to provide a firm-fixed-price quotation, including installation and training as specified in the Statement of Work (Attachment #1). Quotations must include a Technical Quotation, Relevant Experience, Price Quotation, and Terms and Conditions. Evaluations will focus on Technical Capability, Relevant Experience, and Price, with an emphasis on compliance with minimum requirements outlined in the Statement of Work. The government reserves the right to award based on initial quotes without further discussions. Specific clauses and provisions are detailed, including requirements related to the Buy American Act, SAM registration, and payment processes. This procurement underscores the government’s commitment to acquiring necessary technical equipment while fostering opportunities for small businesses, adhering to federal regulations, and ensuring compliance through detailed proposal instructions.
    Attachment 1- Statement of Work.pdf
    The National Institute of Standards and Technology (NIST) intends to procure a custom semi-automated probe station to support research on silicon carbide field effect transistors (FETs), which are critical for high-power semiconductor applications. This system will enable the study of ultra-low gate leakage currents through the transistors' gate dielectrics, addressing significant reliability concerns in the industry. The required specifications for the wafer probing station include a capability for 200 mm wafer sizes, small pad probing, and maintaining an ultra-dry environment to prevent leakage paths due to moisture. Key deliverables include the timely installation and training for NIST staff on the operation and maintenance of the equipment. The contractor is responsible for ensuring all components are new and meet stringent technical specifications, with a warranty covering a minimum of three years post-acceptance. The procurement aligns with NIST’s goal to standardize methods for high-performance microelectronics testing, ultimately enhancing the reliability and development of advanced semiconductor technologies. The performance period for this project is set at seven months from the award date, with clear acceptance and inspection protocols specified for the equipment.
    Lifecycle
    Title
    Type
    Solicitation for purchase of Semi-Automated Probe Station (CHIPS)
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    Combined Synopsis/Solicitation
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