The National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for customized 0.18um complementary metal-oxide semiconductor (CMOS) wafers, which are essential for developing a measurement and application testbed for novel electronic devices. These wafers will utilize a previously developed reticle set owned by NIST and are intended for use in parasitic-free device characterization and non-invasive imaging of complex circuits and systems. Interested vendors are encouraged to submit their capabilities and relevant product information to Joni L. Laster at joni.laster@nist.gov or Forest Crumpler at forest.crumpler@nist.gov, with responses preferred before the closing date. This notice is for market research purposes only and does not constitute a commitment to issue a solicitation or award a contract.