Confocal Microscope System - Sources Sought Notice
ID: NIST-SS25-CHIPS-0029Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/d8441baaac5c44548511b4e6683de24c/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is conducting market research through a Sources Sought Notice to identify potential sources for an automated high-speed and high-resolution confocal scanning microscope. This advanced microscope is intended for imaging biomolecules such as proteins and DNA on various substrates, with a focus on achieving high spatial resolution and signal-to-noise ratio for effective analysis. The procurement is critical for supporting various imaging modalities and ensuring compatibility with existing Carl Zeiss Microscopy instruments, which will lead to significant cost savings. Interested vendors should submit their responses, including technical specifications and company information, to the primary contact, Nina Lin, at nina.lin@nist.gov, preferably before the closing date, as this notice is for market research purposes and does not guarantee a contract award.

    Point(s) of Contact
    Nina Lin
    nina.lin@nist.gov
    Tracy Retterer
    Tracy.retterer@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Confocal Microscope System - Sources Sought Notice
    Currently viewing
    Sources Sought
    Similar Opportunities
    Sources Sought Notice for Upgrade of Existing Resonant Soft X-ray Scattering End Station
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is conducting market research through a Sources Sought Notice for the upgrade of the existing Resonant Soft X-ray Scattering (RSoXS) end station located at the National Synchrotron Light Source II (NSLS-II) in Upton, New York. The objective is to identify potential sources capable of providing a commercial solution that meets specific technical requirements, including the integration of a 2-circle goniometer and enhancements for soft X-ray reflectivity and resonant critical dimension small angle scattering (res-CDSAXS) capabilities. This upgrade is critical for advancing research in soft matter systems relevant to industries such as semiconductor manufacturing and organic electronics, with an emphasis on minimizing downtime during installation. Interested vendors should submit their responses to the primary contact, Nina Lin, at nina.lin@nist.gov, and ensure they are registered in SAM.gov. The notice does not obligate the government to award a contract and is intended solely for market research purposes.
    Swept-Wavelength Spectroscopy System
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a Swept-Wavelength Spectroscopy System to enhance measurement science critical for semiconductor manufacturing. The system must meet stringent specifications, including a wavelength coverage of 1450 nm to 1650 nm, high spectral resolution, and advanced features for polarization control and optical power measurement. This procurement is vital for advancing metrology in the semiconductor supply chain, supporting the development of next-generation microelectronics. Interested vendors should contact Junee Johnson at junee.johnson@nist.gov for further details, and responses are encouraged before the closing date, with no solicitation currently available.
    Restoration and Service Contract for Quanta FEG 200 ESEM
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a restoration and service contract for a Quanta FEG 200 Environmental Scanning Electron Microscope (ESEM) located at its Gaithersburg, Maryland campus. The contractor will be responsible for restoring the microscope to operational status, which includes checking and repairing essential subsystems, performing mechanical and electronic alignments, and updating software controls. This equipment is crucial for SEM imaging and in-situ mechanical testing, and the selected contractor will also provide a comprehensive service contract that includes support from factory-trained engineers and preventive maintenance visits. Interested parties should contact Forest Crumpler or Donald Collie via email and ensure their company is registered in SAM.gov to respond to this sources sought notice, which is intended for market research purposes only and does not guarantee a contract award.
    Photonic probe station
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is seeking sources for a photonic probe station to enhance measurement methods and test structures for integrated photonics manufacturing. The procurement aims to address the critical need for automated and flexible electro-optic probing of multiple photonic test structures at the die level, which is essential for advancing semiconductor manufacturing technologies. This initiative is part of NIST's CHIPS Metrology Program, which focuses on developing metrology to support the next-generation microelectronics industry in the United States. Interested vendors should respond to Junee Johnson at junee.johnson@nist.gov with detailed information about their capabilities and relevant products by the specified deadline, ensuring they are registered and active in SAM.gov.
    Optic Interferometer System
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding the procurement of a 1 Axis Real Time Fiber Optic Interferometer System. This system must meet specific performance criteria, including a compact laser system capable of precise displacement measurements with high accuracy and environmental compensation, as well as an integrated web interface for diagnostics. Such systems are crucial for laboratory applications that require precise measurement and control of industrial process variables. Interested parties are encouraged to submit their capabilities and insights regarding the requirements by November 28, 2024, and can direct inquiries to Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Tracy Retterer at Tracy.retterer@nist.gov.
    High-pressure XPS System
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a sources sought notice for a High-pressure XPS System. This procurement aims to identify potential sources capable of providing a differentially pumped Ambient-Pressure X-ray Photoelectron Spectroscopy (APXPS) spectrometer, which is crucial for real-time monitoring in semiconductor process development and control. The system must meet specific technical requirements, including a custom-made reaction chamber and advanced detection capabilities under varying pressure conditions. Interested vendors should submit their responses, including company details and equipment specifications, to Cielo Ibarra at cielo.ibarra@nist.gov by the deadline of November 21, 2024, at 12:00 PM Eastern Time.
    HP Pump Laser
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking vendors for a 100W 532 nm Pump laser system through a Combined Sources Sought Notice. This procurement aims to enhance measurements of thermal transport at the nanoscale, utilizing high-harmonic generation from a stable optical regenerative amplifier, with specific requirements for the laser's design and performance metrics. The initiative is critical for advancing NIST's capabilities in analytical laboratory instrumentation, and interested vendors must respond with product details and compliance information by November 19, 2024. For inquiries, vendors can contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Tracy Retterer at Tracy.retterer@nist.gov.
    Notice of Intent to Noncompetitively Acquire CHIPS LEAP 6000 XR atom probe instrument
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire a CHIPS LEAP 6000 XR atom probe instrument to enhance its materials characterization capabilities. This procurement aims to replace an outdated atom probe system with a new Local Electrode Atom Probe (LEAP) that meets specific technical requirements, including the ability to analyze nanoscale specimens and generate 3D reconstructions for various materials, such as semiconductor materials and metal alloys. The acquisition is crucial for NIST's mission to improve measurement science and develop reference materials to enhance the accuracy and reproducibility of atomic-level measurements. Interested parties that believe they can meet the requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov for further information.
    High-Temperature In-Situ (HTIS) Indenter
    Active
    Commerce, Department Of
    The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking sources for a High-Temperature In-Situ (HTIS) Indenter, aimed at enhancing the understanding of material properties relevant to the semiconductor industry. The procurement focuses on an instrumented indentation device capable of operating under vacuum conditions and at temperatures ranging from room temperature to 400°C, facilitating mechanical characterization and in-situ observation of deformation behaviors in materials. This initiative is crucial for advancing research in semiconductor microelectronics, energy conversion, and additive manufacturing. Interested vendors should submit their responses, including company details and product specifications, to the primary contact, Forest Crumpler, at forest.crumpler@nist.gov, with responses encouraged before the closing date.
    Notice of Intent to Noncompetitively Acquire CHIPS Pulsed Ultraviolet Light Source
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire a Pulsed Vacuum Ultraviolet (VUV) Light Source for its Boulder, Colorado campus. This system is crucial for triggering the experimental Atom Probe Instrument (APT) and aims to enhance the analysis of semiconductor materials as part of the CHIPS project. NIST has identified specific requirements for the light source, including the generation of VUV light at a wavelength of 147 nm, a pulse energy exceeding 10 nJ, a repetition rate between 50 kHz and 100 kHz, and a pulse duration of less than 1 ps. Interested parties that believe they can meet these requirements are encouraged to respond to the notice by providing their capabilities and relevant information to the primary contact, Tracy Retterer, at Tracy.retterer@nist.gov, or the secondary contact, Forest Crumpler, at forest.crumpler@nist.gov.