Notice of Intent to Noncompetitively Acquire CHIPS Pulsed Ultraviolet Light Source
ID: NIST-NOI25-CHIPS-0010Type: Special Notice
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/a85bf149f32943a0897fa6b4f35805d9/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire a Pulsed Vacuum Ultraviolet (VUV) Light Source for its Boulder, Colorado campus. This system is crucial for triggering the experimental Atom Probe Instrument (APT) and aims to enhance the analysis of semiconductor materials as part of the CHIPS project. NIST has identified specific requirements for the light source, including the generation of VUV light at a wavelength of 147 nm, a pulse energy exceeding 10 nJ, a repetition rate between 50 kHz and 100 kHz, and a pulse duration of less than 1 ps. Interested parties that believe they can meet these requirements are encouraged to respond to the notice by providing their capabilities and relevant information to the primary contact, Tracy Retterer, at Tracy.retterer@nist.gov, or the secondary contact, Forest Crumpler, at forest.crumpler@nist.gov.

    Point(s) of Contact
    Tracy Retterer
    Tracy.retterer@nist.gov
    Forest Crumpler
    forest.crumpler@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Notice of Intent to Noncompetitively Acquire CHIPS Pulsed Ultraviolet Light Source
    Currently viewing
    Special Notice
    Similar Opportunities
    HP Pump Laser
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking vendors for a 100W 532 nm Pump laser system through a Combined Sources Sought Notice. This procurement aims to enhance measurements of thermal transport at the nanoscale, utilizing high-harmonic generation from a stable optical regenerative amplifier, with specific requirements for the laser's design and performance metrics. The initiative is critical for advancing NIST's capabilities in analytical laboratory instrumentation, and interested vendors must respond with product details and compliance information by November 19, 2024. For inquiries, vendors can contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Tracy Retterer at Tracy.retterer@nist.gov.
    Photonic probe station
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is seeking sources for a photonic probe station to enhance measurement methods and test structures for integrated photonics manufacturing. The procurement aims to address the critical need for automated and flexible electro-optic probing of multiple photonic test structures at the die level, which is essential for advancing semiconductor manufacturing technologies. This initiative is part of NIST's CHIPS Metrology Program, which focuses on developing metrology to support the next-generation microelectronics industry in the United States. Interested vendors should respond to Junee Johnson at junee.johnson@nist.gov with detailed information about their capabilities and relevant products by the specified deadline, ensuring they are registered and active in SAM.gov.
    Notice of Intent to Noncompetitively Acquire CHIPS LEAP 6000 XR atom probe instrument
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire a CHIPS LEAP 6000 XR atom probe instrument to enhance its materials characterization capabilities. This procurement aims to replace an outdated atom probe system with a new Local Electrode Atom Probe (LEAP) that meets specific technical requirements, including the ability to analyze nanoscale specimens and generate 3D reconstructions for various materials, such as semiconductor materials and metal alloys. The acquisition is crucial for NIST's mission to improve measurement science and develop reference materials to enhance the accuracy and reproducibility of atomic-level measurements. Interested parties that believe they can meet the requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov for further information.
    Sources Sought Notice for Upgrade of Existing Resonant Soft X-ray Scattering End Station
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is conducting market research through a Sources Sought Notice for the upgrade of the existing Resonant Soft X-ray Scattering (RSoXS) end station located at the National Synchrotron Light Source II (NSLS-II) in Upton, New York. The objective is to identify potential sources capable of providing a commercial solution that meets specific technical requirements, including the integration of a 2-circle goniometer and enhancements for soft X-ray reflectivity and resonant critical dimension small angle scattering (res-CDSAXS) capabilities. This upgrade is critical for advancing research in soft matter systems relevant to industries such as semiconductor manufacturing and organic electronics, with an emphasis on minimizing downtime during installation. Interested vendors should submit their responses to the primary contact, Nina Lin, at nina.lin@nist.gov, and ensure they are registered in SAM.gov. The notice does not obligate the government to award a contract and is intended solely for market research purposes.
    Sources Sought Notice for 2D Soft X-ray Camera
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice for a 2D Soft X-ray Camera to enhance its resonant soft X-ray scattering (RSoXS) end station at NSLS-II. The procurement aims to identify commercial solutions that meet stringent specifications, including a fully vacuum-compatible detector with high quantum efficiency, a high frame rate, and a compact design suitable for integration into a goniometer system. This upgrade is critical for advancing research in soft matter systems, which have applications in various fields such as organic electronics and biological systems. Interested vendors should submit their responses, including technical specifications and company information, to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, ensuring they are registered and active in SAM.gov.
    Optical Table and Leg Kit
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST), part of the Department of Commerce, is seeking sources for an optical table and leg kit to support advanced materials science research under the CHIPS and Science Act. The required equipment will facilitate the operation of a confocal Raman microscope spectrometer, which is crucial for conducting spatially resolved Raman mapping in semiconductor materials, thereby enhancing U.S. semiconductor manufacturing capabilities. This procurement is vital for improving electrochemical fabrication techniques and ensuring the reliability of microelectronic interconnects. Interested vendors should respond to the sources sought notice by contacting Junee Johnson at junee.johnson@nist.gov, providing detailed information about their products and capabilities, with responses due by the specified deadline.
    Notice of Intent to Sole Source High Efficiency Photodiodes
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) intends to negotiate a sole-source contract with Hamamatsu, Corp. for the procurement of large-area silicon photodiodes, which are critical for optical radiation calibration. The project aims to enhance optical efficiency in various applications, including the establishment of international standards and research initiatives, with a focus on high-quality components. Interested parties that can meet the requirements must submit their capabilities in writing by the specified deadline, with an estimated award date of December 15, 2024. For inquiries, contact Lisa Stevens at lisa.stevens@nist.gov or Angela Hitt at angela.hitt@nist.gov.
    Confocal Raman Microscope Spectrometer
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources for a Confocal Raman Microscope Spectrometer, which is essential for advanced analysis in computer chip manufacturing. The procurement aims to acquire a sophisticated instrument capable of mapping local surface chemistry during the fabrication of microelectronics interconnects, utilizing advanced spectroscopic methods such as shell isolated nanoparticle-enhanced Raman spectroscopy (SHINERS). Interested vendors are encouraged to submit their capabilities and relevant product information to Junee Johnson at junee.johnson@nist.gov, with responses due by the specified deadline. This notice serves solely for market research purposes and does not constitute a commitment to issue a solicitation or award a contract.
    Scanning Threshold Particle Counter (STPC)
    Active
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources capable of providing a Scanning Threshold Particle Counter (STPC) to enhance semiconductor manufacturing yield through improved detection of impurities in cleaning chemicals. The STPC must be a turnkey system that adheres to SEMI C79 and SEMI C93 standards, capable of detecting nonvolatile residue particles and native particles in ultrapure water, with integrated particle generation and detection across three size channels (≥ 3 nm, ≥ 9 nm, and ≥ 15 nm). This equipment is critical for ensuring the purity of materials used in semiconductor fabrication, particularly as the industry moves towards next-generation chips requiring even higher purity levels. Interested parties should submit their responses, including company details and product specifications, to the primary contact, Jenna Bortner, at jenna.bortner@nist.gov, by the specified deadline, noting that this notice is for market research purposes and does not constitute a commitment to award a contract.
    Scanning Threshold Particle Counter
    Active
    Commerce, Department Of
    The National Institute of Standards and Technology (NIST) is conducting a Sources Sought Notice to identify potential sources for a Scanning Threshold Particle Counter (STPC) to enhance semiconductor manufacturing yield through improved detection of impurities in ultrapure water. The STPC must be a turnkey system that complies with SEMI C79 and SEMI C93 standards, capable of detecting nonvolatile residue particles and native particles in ultrapure water, with integrated particle generation and detection across three size channels. This procurement is critical as it supports the semiconductor industry's need for advanced metrological capabilities to ensure material purity, which is essential for the production of next-generation chips. Interested vendors should submit their responses, including company information and equipment capabilities, to Cielo Ibarra at cielo.ibarra@nist.gov, with no proposals or quotations required at this stage.