The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to noncompetitively acquire a CHIPS LEAP 6000 XR atom probe instrument to enhance its materials characterization capabilities. This procurement aims to replace an outdated atom probe system with a new Local Electrode Atom Probe (LEAP) that meets specific technical requirements, including the ability to analyze nanoscale specimens and generate 3D reconstructions for various materials, such as semiconductor materials and metal alloys. The acquisition is crucial for NIST's mission to improve measurement science and develop reference materials to enhance the accuracy and reproducibility of atomic-level measurements. Interested parties that believe they can meet the requirements are encouraged to contact Tracy Retterer at tracy.retterer@nist.gov or Donald Collie at donald.collie@nist.gov for further information.