The National Institute of Standards and Technology (NIST) is seeking sources for a full turnkey test vehicle to study the reliability of materials used in the advanced packaging of semiconductor chips. The procurement aims to identify vendors capable of providing design and fabrication capabilities for logic and memory chips, silicon interposers, high-density organic substrates, and a complete assembly system, including functionality and long-term reliability testing. This initiative is crucial for enhancing the understanding of failure mechanisms in semiconductor packaging materials, which are vital for the performance and longevity of electronic devices. Interested parties should contact Nina Lin at nina.lin@nist.gov or Donald Collie at donald.collie@nist.gov for further details, noting that this is a Sources Sought Notice for market research purposes only and does not constitute a solicitation for contract award.