The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking information from vendors regarding a thermocouple scanning module compatible with its Vero Atomic Force Microscope (AFM). This module is crucial for accurately measuring temperature variations at nanoscale and microscale levels in semiconductor materials under various environmental conditions, requiring specific functionalities such as wear-resistant probes and the ability to measure temperatures up to 500°C. Interested vendors are encouraged to submit detailed responses that include company information, technical specifications, performance capabilities, and any limitations in meeting NIST's requirements. Responses will be used for market research purposes and do not guarantee a solicitation or contract award; interested parties should contact Forest Crumpler at forest.crumpler@nist.gov for further information.