High-Temperature Multi-Angle Light Scattering Detector (HT-MALS)
ID: 1333ND25QNB640385Type: Special Notice
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Set Aside

No Set aside used (NONE)

Original Source

https://sam.gov/opp/811e9816b3c14498836c082906751fb2/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a High-Temperature Multi-Angle Light Scattering Detector (HT-MALS) to enhance its capabilities in measuring absolute weight average molar mass and polymer conformation plots for NIST standards and other polymers. The primary objective is to replace aging legacy equipment that is becoming obsolete and to improve detection capabilities for large macromolecules with complex branching distributions. This procurement is critical for maintaining continuity in measurements of Standard Reference Materials (SRMs) and ensuring compatibility with existing systems, particularly the Wyatt HT-GPC instrument. The contracting officer intends to noncompetitively solicit and award a purchase order to Waters Technology Corporation for the DAWNâ-UHT (NEON) detector, as it is the only compatible option identified. Interested parties can contact Harry L. Brubaker at Harry.Brubaker@nist.gov or call 301-975-8330 for further information.

    Point(s) of Contact
    Harry L. Brubaker
    (301) 975-8330
    Harry.Brubaker@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    High-Temperature Multi-Angle Light Scattering Detector (HT-MALS)
    Currently viewing
    Special Notice
    Similar Opportunities
    System upgrades for Magneto-Raman and photoluminescence spectroscopy
    Buyer not available
    The National Institute of Standards and Technology (NIST) is seeking sources for system upgrades to its magneto-Raman and photoluminescence spectroscopy instrument, which is essential for evaluating 2D and wide band gap materials in the semiconductor industry. The procurement includes a new magnet power supply, a service contract, and compatible components such as low-temperature compatible, long working distance apochromatic objectives, titanium sample holders, and titanium screws for mounting electrical devices. These upgrades are critical for analyzing optical spectroscopy responses under magnetic fields at cryogenic temperatures. Interested vendors should contact Junee Johnson at junee.johnson@nist.gov for further details, as this notice serves market research purposes and does not guarantee a contract award.
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Sources Sought Notice for Coupled Device Detector Camera System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding a Coupled Device Detector Camera System through a sources sought notice (NIST-SS26-CHIPS-25). This procurement aims to support the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project, which focuses on enhancing plasma etching efficiencies via in situ optical diagnostics. The required system includes an intensified electron multiplication charge coupled device (IEMCCD) camera with specific technical specifications, including ultra-low noise, high gain, and fast optical emission spectroscopy capabilities. Interested parties should provide detailed company information, product specifications, and performance capabilities, and may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.
    Sources Sought Notice for a MIR Camera
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice (NIST-SS26-CHIPS-23) to identify potential sources for a mid-infrared camera and associated lenses. This equipment is critical for the Digital Twins for Atomic Layer Deposition Processes Project, which aims to develop and validate digital twin models for atomic layer deposition processes, requiring high sensitivity and rapid imaging capabilities across the mid-infrared spectral region. Interested vendors are requested to provide detailed company information, product specifications, customization capabilities, and pricing by December 15, 2025, to assist in market research for this procurement. For further inquiries, respondents may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov.
    Sole Source Justification - Far-Infrared Dual Frequency Comb System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Far-Infrared Dual Frequency Comb System through a sole source justification. This procurement aims to acquire specialized laboratory equipment and supplies that are critical for advancing research and development in precision measurement and metrology. The system is essential for various scientific applications, including spectroscopy and telecommunications, where high precision is required. Interested parties can reach out to Daniel Kent at daniel.kent@nist.gov or call 303-497-6533 for further information regarding this opportunity.
    Environmental test chamber
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding the procurement of an Environmental Test Chamber and a Water Recirculation System as part of a Sources Sought Notice (NIST-SS26-CHIPS-29). The Environmental Test Chamber must meet specific requirements, including a workspace of over 1.5 cubic feet, a temperature range of -35°C to +175°C, and humidity control between 10%-95% RH, among other technical specifications, to support metrology research for semiconductor device manufacturing. This procurement is crucial for evaluating materials used in semiconductor devices, thereby enhancing device reliability and performance. Interested parties should submit their responses, including company information and product specifications, to Junee Johnson at junee.johnson@nist.gov, as this notice is for market research purposes and no solicitation is currently available.
    ScanWave Pro-Electronic Probe Interface Module (ePIM)
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources for a fully electronically tunable Probe Interface Module (ePIM) to replace an existing manually tunable module used with their Oxford/Asylum Research AFM MFP-3D system. This procurement is essential for advancing NIST's measurement science research, particularly in addressing gaps within the semiconductor supply chain and R&D ecosystem. The required ePIM must feature electronic tunability, compatibility with the existing AFM and its software, and include corresponding software solutions. Interested parties are encouraged to contact Junee Johnson at junee.johnson@nist.gov for further details, as this notice is for market research purposes only and does not guarantee a solicitation or contract award.
    Total Assurance Plan
    Buyer not available
    The Department of Defense, through the Naval Air Warfare Center Aircraft Division, is seeking to procure maintenance and service for Waters Technology Corporation instrumentation at the Naval Fuels & Lubricants Chemistry Laboratory located in Patuxent River, Maryland. This procurement, identified as solicitation N0042126Q1028, is valued at approximately $94,758.08 and is intended to be awarded on a sole source basis to Waters Corporation, emphasizing the importance of their specialized equipment in supporting the laboratory's operations. Interested vendors must submit their capabilities and quotes by December 10, 2025, at 12:00 PM EST, with all submissions directed to JaNae Lester at janae.a.lester.civ@us.navy.mil.
    Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
    Buyer not available
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.