ScanWave Pro-Electronic Probe Interface Module (ePIM)
ID: NIST-SS26-CHIPS-28Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/22295a3826674ac086a01a67d4540bc9/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources for a fully electronically tunable Probe Interface Module (ePIM) to replace an existing manually tunable module used with their Oxford/Asylum Research AFM MFP-3D system. This procurement is essential for advancing NIST's measurement science research, particularly in addressing gaps within the semiconductor supply chain and R&D ecosystem. The required ePIM must feature electronic tunability, compatibility with the existing AFM and its software, and include corresponding software solutions. Interested parties are encouraged to contact Junee Johnson at junee.johnson@nist.gov for further details, as this notice is for market research purposes only and does not guarantee a solicitation or contract award.

    Point(s) of Contact
    Junee Johnson
    junee.johnson@nist.gov
    Files
    Title
    Posted
    Sources Sought NIST-SS26-CHIPS-28.docx
    NIST has issued a Sources Sought Notice for a fully electronically tunable Probe Interface Module (ePIM) to replace a fragile, manually tunable PIM used with their Oxford/Asylum Research AFM MFP-3D system. This procurement is critical for NIST's measurement science research to address semiconductor supply chain and R&D ecosystem gaps. The required ePIM must have electronic tunability, compatibility with the existing AFM and its software, and corresponding software. NIST is seeking information from potential sources, requesting company details, product specifications, performance capabilities, customization options, manufacturing location, NAICS code information, available services (installation, training, maintenance), standard terms, facility renovation services, pricing, federal contract availability, customer references, and any additional relevant information. This notice is for market research only and does not guarantee a solicitation or contract award.
    Lifecycle
    Title
    Type
    ScanWave Pro-Electronic Probe Interface Module (ePIM)
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    Sources Sought
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