Solicitation - Thermo-Reflectance Probe Station
ID: NB672010-25-01853Type: Solicitation
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Semiconductor and Related Device Manufacturing (334413)

PSC

SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE (5961)

Original Source

https://sam.gov/opp/f2a92315b04841cd9199a6857370ffe0/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is soliciting proposals for the procurement of a Thermo-Reflectance Probe Station to enhance their measurement capabilities for semiconductor devices. This semi-automatic microwave probe station is essential for conducting automated thermal measurements under operational conditions, which supports ongoing research and validation of microwave calibration standards. The procurement emphasizes the need for compatibility with existing Microsanj hardware, advanced imaging capabilities, and specific installation and training requirements, with a firm delivery date set for March 31, 2026. Interested vendors should submit their quotations electronically, adhering to the specified evaluation criteria, and may contact Daniel Kent at daniel.kent@nist.gov or 303-497-6533 for further inquiries.

    Point(s) of Contact
    Daniel Kent
    (303) 497-6533
    daniel.kent@nist.gov
    Files
    Title
    Posted
    Attachment 1 - Draft Specifications.pdf
    The Communications Technology Laboratory, specifically the Radio Frequency Technology Division's Guided Wave Metrology Group, seeks a new semi-automatic microwave probe station to enhance its thermo-reflectance measurement system. This upgrade aims to facilitate automated temperature distribution measurements of semiconductor devices and circuits during active operations. The new system must be compatible with the existing Microsanj thermo-reflectance hardware to support critical research projects involving chip-scale devices under different temperature conditions. The specification outlines the requirements for a 200mm probe station, which includes a vacuum system, automated chuck positioning, integrated software, thermal control, and specific imaging capabilities. The procurement also entails on-site installation, training for up to three individuals, and the necessary electronic manuals. Delivery to NIST Boulder is expected by March 31, 2026. This initiative underscores the laboratory's commitment to advancing semiconductor measurement capabilities to validate theoretical models essential for various applications in microwave calibration standards.
    Attachment 1 - Specifications.pdf
    The Communications Technology Laboratory, specifically the Radio Frequency Technology Division, is requesting the procurement of a semi-automatic microwave probe station to enhance their thermo-reflectance measurement capabilities for semiconductor devices. This upgrade is essential for automated measurement of temperature distribution under operational conditions, which supports ongoing research projects and the validation of models for microwave calibration standards at varying temperatures. The specifications detail the need for a station that is compatible with existing Microsanj hardware and can accommodate various wafer sizes while functioning at low temperatures without condensation. Key features include a programmable microscope, automated chuck, integrated vibration isolation, and advanced imaging capabilities. The proposal also outlines installation, training, and delivery requirements, with a firm delivery date set for March 31, 2026. Overall, this request aims to significantly advance the laboratory’s ability to conduct high-precision thermal measurements, thereby facilitating improved research and development in semiconductor technology.
    Attachment 2 - Brand Name Justification.pdf
    The document from the United States Department of Commerce's National Institute of Standards and Technology (NIST) outlines a brand name justification for the procurement of a Microsanj Thermo-Reflectance Probe Station. The station is essential due to its compatibility with existing Microsanj thermos-reflectance hardware and software already utilized by NIST. This compatibility is crucial for ongoing research into the performance of integrated devices and circuits under high power conditions, particularly for microelectronics and advanced communications applications. The potential use of a different system would incur significant time and financial costs for NIST, as it would require replacing all current systems. The justification is signed by Daniel Kent, the Contracting Officer, affirming the necessity of maintaining consistency in their technology.
    NB672010-25-01853 BLDR Thermo-Reflectance Probe Station RFQ.pdf
    The document outlines a Request for Quotation (RFQ) for a Thermo-Reflectance Probe Station, including installation, training, and shipping, issued under the authority of FAR 13. The solicitation number is NB672010-25-01853, and it falls under NAICS 334413 – Semiconductor and Related Device Manufacturing. Quotations are to be submitted electronically, adhering to specified evaluation criteria focusing on the technical capability and pricing of the offered items. The RFQ details mandatory provisions and clauses that apply to this acquisition, emphasizing the need for comprehensive quotations that include proof of capabilities and firm fixed prices. Evaluation will prioritize technical capability but will also assess price reasonableness without realism checks. Regulatory compliance, including SAM registration and various other FAR clauses, is emphasized. The document requires explicit communications related to the solicitation number and provides guidance on submission logistics, delivery details, and invoicing instructions, establishing clear bounds for contractor engagement with government operations. The solicitation is set to close as specified, with contact information for the Contract Specialist provided for further inquiries.
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    Solicitation - Thermo-Reflectance Probe Station
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