Sources Sought Notice for Xray Tomography Software
ID: NIST-SS26-CHIPS-26Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Software Publishers (513210)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/66011312b26643d59a71793d0353ad62/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking potential sources for X-ray computed tomography (XCT) simulation software through a sources sought notice (NIST-SS26-CHIPS-26). This software is vital for the NIST CHIPS Metrology R&D program's nondestructive defect detection metrology project, which aims to enhance the accuracy and efficiency of semiconductor failure analysis by generating simulated data sets for XCT defect detection. Key requirements for the software include the ability to simulate various X-ray sources, utilize 3D surface meshes, simulate scattering effects, and output radiographs in standard image formats, among other capabilities. Interested parties must respond with detailed company information and product specifications by December 15, 2025, and can contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.

    Point(s) of Contact
    Elizabeth Timberlake
    elizabeth.timberlake@nist.gov
    Donald Collie
    donald.collie@nist.gov
    Files
    Title
    Posted
    Sources Sought Notice.docx
    NIST has issued a sources sought notice, NIST-SS26-CHIPS-26, to identify potential sources for X-ray computed tomography (XCT) simulation software. This software is crucial for the NIST CHIPS Metrology R&D program's nondestructive defect detection metrology (NDDM) project, aiming to develop simulated data sets to improve XCT defect detection and accuracy. The software will generate data sets at various acquisition settings, validating against physical data to enhance semiconductor failure analysis efficiency. Key technical requirements include simulating various X-ray sources (1 keV to 450 keV, monochromatic/polychromatic, adjustable spot size), utilizing 3D surface meshes for simulation objects, simulating scattering effects (e.g., Monte-Carlo), considering detector configurations and efficiency, simulating diverse scanning trajectories, and offering scripting capabilities (preferably Python-based). The software must output radiographs in standard image formats (e.g., tif/tiff) and ideally possess reconstruction and phase contrast simulation/retrieval capabilities. NIST requires a permanent license for one user and expects responses detailing company information, product specifications, performance capabilities, customization options, manufacturing location, NAICS code status, available services (maintenance, training), standard terms, and any existing federal contract availability by December 15, 2025.
    Lifecycle
    Title
    Type
    Sources Sought Notice for Xray Tomography Software
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