The National Institute of Standards and Technology (NIST) is conducting market research through a Sources Sought Notice to identify potential sources for a Local Electrode Atom Probe (LEAP) tomography system. This advanced analytical instrument is essential for materials characterization, enabling NIST scientists to analyze nanoscale samples and improve measurement accuracy and reproducibility. The LEAP system will be utilized for various applications, including semiconductor materials and metal alloys, and must meet specific technical requirements, including ultra-high vacuum capabilities and advanced laser systems. Interested vendors should submit their responses, including company information and product specifications, to the primary contact, Tracy Retterer, at Tracy.retterer@nist.gov, by the specified deadline. This notice is for market research purposes only and does not constitute a commitment to issue a solicitation or award a contract.