PD-33-0012; Scanning Electron Microscope (SEM)
ID: N64498-26-SIMACQ-PD-33-0012Type: Sources Sought
Overview

Buyer

DEPT OF DEFENSEDEPT OF THE NAVYNSWC PHILADELPHIA DIVPHILADELPHIA, PA, 19112-1403, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES (6650)

Set Aside

No Set aside used (NONE)

Original Source

https://sam.gov/workspace/contract/opp/73f98f81b60a4a919f15eb0946950b87/view
Timeline
    Description

    The Department of Defense, through the Naval Surface Warfare Center, Philadelphia Division (NSWCPD), is seeking to procure one (1) Scanning Electron Microscope (SEM) to support its Machinery Research, Logistics & Ship Integrity Department. The SEM must meet specific technical requirements, including a Schottky Emitter, SE and BSE detectors, a chamber for 300mm specimens, and an integrated EDS system, with functional capabilities such as <3nm resolution at 1kV and variable pressure capabilities (10-150 Pa). This procurement is critical for metallographic analysis and imaging, and interested businesses are invited to submit a 5-page Capability Statement by December 23, 2025, to demonstrate their ability to meet these requirements. Responses should be sent electronically to Jenny Tomeo at jenny.e.tomeo.civ@us.navy.mil, and the anticipated contract type is Firm Fixed-Price under Simplified Acquisition Procedures, with a Request for Proposal expected in February 2026.

    Point(s) of Contact
    Jenny Tomeo
    (445) 227-7612
    Jenny.e.Tomeo.civ@us.navy.mil
    Files
    Title
    Posted
    Sources Sought_331 SEM SAPCOM.docx
    The Naval Surface Warfare Center, Philadelphia Division (NSWCPD) is seeking a new contract for one (1) newly manufactured Scanning Electron Microscope (SEM) for metallographic analysis and imaging. This Sources Sought Notice, N64498-26-SIMACQ-PD-33-0012, is for informational purposes only and is not a Request for Proposal. The SEM must feature a Schottky Emitter, SE and BSE detectors, a chamber for 300mm specimens, and an integrated EDS system. Functional requirements include <3nm resolution at 1kV and variable pressure capabilities (10-150 Pa), with imaging software capable of stitching multiple images. The anticipated contract type is Firm Fixed-Price under Simplified Acquisition Procedures, with an RFP expected in February 2026. Interested businesses (NAICS 334516) must submit a 5-page Capability Statement by December 23, 2025, demonstrating technical ability and capacity to meet the requirements.
    Lifecycle
    Title
    Type
    PD-33-0012; Scanning Electron Microscope (SEM)
    Currently viewing
    Sources Sought
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