Solicitation - High-Temperature Electrical Probe System
ID: NB642030-25-01948Type: Combined Synopsis/Solicitation
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Semiconductor and Related Device Manufacturing (334413)

PSC

SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE (5961)

Original Source

https://sam.gov/opp/25d0a8d8c34d4243b6f8e1a688fbae6c/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is seeking to procure a high-temperature electrical probe system capable of operating at temperatures up to 1000 °C, aimed at enhancing metrology for wide-bandgap semiconductors critical for aerospace and harsh-environment applications. This procurement addresses the need for standardized high-temperature measurement techniques to evaluate the reliability and longevity of wide-bandgap devices, with the contractor required to provide a new probe station that includes safety features, temperature control, and a warranty for at least one year. Although the project is currently canceled due to budgetary constraints, NIST plans to re-issue the Request for Quotation (RFQ) in early fiscal year 2026 when funding becomes available. For further inquiries, interested parties may contact Daniel Kent at daniel.kent@nist.gov or by phone at 303-497-6533.

    Point(s) of Contact
    Daniel Kent
    (303) 497-6533
    daniel.kent@nist.gov
    Files
    Title
    Posted
    Amendment 1 - RFQ NB642030-25-01948 - High-Temperature Electrical Probe System.pdf
    Amendment 1 to Request for Quote (RFQ) NB642030-25-01948 addresses the cancellation of a high-temperature electrical probe system project by the National Institute of Standards and Technology (NIST). The cancellation is attributed to budgetary constraints and a shift in prioritization for the current fiscal year. The government anticipates re-issuing the RFQ in the future when funding is expected to become available, specifically aiming for early fiscal year 2026. The document is signed by Contracting Officer Daniel Kent, affirming the administrative decision. This summary reflects NIST's responsiveness to fiscal realities while maintaining a commitment to future procurement plans in the field of electrical probe systems.
    Attachment 1 - Specifications.pdf
    The National Institute of Standards and Technology (NIST) seeks to acquire a high-temperature electrical probe system capable of operating up to 1000 °C to enhance metrology for wide-bandgap semiconductors essential for aerospace and harsh-environment applications. This initiative addresses the current gap in standardized high-temperature measurement techniques needed to evaluate the reliability and longevity of WBG devices. The contractor must supply a new probe station that includes safety features, temperature control, and a warranty covering parts and labor for at least one year. Performance verification will occur at NIST, Gaithersburg, Maryland, after installation, ensuring compliance with specified requirements. The project seeks completion within six months, with all work conducted at the contractor's facility, emphasizing the importance of safety and regulatory adherence during the installation phase. This request aims to bolster U.S. leadership in high-temperature semiconductor technologies through enhanced metrology infrastructure.
    Attachment 1 - Specifications Draft.pdf
    The National Institute of Standards and Technology (NIST) is seeking to acquire a High-Temperature Electrical Probe System capable of measuring electrical properties of wide-bandgap (WBG) semiconductors at temperatures up to 1000 °C. This acquisition addresses the existing gap in standardized metrology that limits the deployment of WBG technologies critical for high-performance applications in aerospace and electronics, which often operate under extreme conditions. The requirement includes the provision of one complete probe station that includes multiple probes, temperature control capabilities, operational vacuum conditions, and safety features. The contractor must ensure installation at NIST in Gaithersburg, Maryland, following a six-month performance period post-award. Additionally, a one-year warranty covering all aspects of the system is required. The deliverables consist of the probe system and an updated manual, both due within six months of contract award. Acceptance will be based on verification through calibrated reference instruments. Adherence to safety regulations during installation is also mandated. This proposal plays a vital role in advancing foundational measurement science, supporting U.S. leadership in high-temperature semiconductor technologies.
    NB642030-25-01948 - High-Temperature Electrical Probe System RFQ.pdf
    The document outlines a Request for Quotation (RFQ) from the National Institute of Standards and Technology (NIST) for a High-Temperature Electrical Probe System, with solicitation number NB642030-25-01948. It follows the Simplified Acquisition Procedures under FAR 13. The RFQ is open to all vendors, but awards will only be made when funding is available. It includes specifications for the required item, including quantity, shipping, installation, and warranty. Quotations must be submitted in a specific format by a designated deadline and will be evaluated based on technical capability and price, with a focus on the lowest price that meets technical standards. Offerors must provide their SAM Unique Entity ID and ensure compliance with various federal acquisition regulations, including representations concerning domestic content and supply chain security. The document emphasizes adherence to government contracting protocols, including terms for invoicing and delivery, and outlines the processes for evaluating compliance with federal labor laws and the Buy American Act. Overall, this RFQ is a formal solicitation for commercial items aimed at securing procurement in compliance with federal regulations.
    Lifecycle
    Title
    Type
    Solicitation - High-Temperature Electrical Probe System
    Currently viewing
    Combined Synopsis/Solicitation
    Sources Sought - High-Temperature Electrical Probe System
    Sources Sought
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