Field-Emission Scanning Electron Microscope (FE-SEM)
ID: 4-B175-Q-00761-00Type: Solicitation
Overview

Buyer

ENERGY, DEPARTMENT OFENERGY, DEPARTMENT OFARGONNE NATL LAB - DOE CONTRACTORLemont, IL, 60439, USA

NAICS

Other Professional Equipment and Supplies Merchant Wholesalers (423490)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/41984e85609e47368231dd24627035b2/view
Timeline
    Description

    The Department of Energy, through Argonne National Laboratory, is seeking proposals for the procurement of one Field-Emission Scanning Electron Microscope (FE-SEM) to enhance its Center for Nanoscale Materials. The procurement includes the supply, installation, training, and warranty for the FE-SEM system, which is critical for advancing research in nanoscale materials characterization across various energy and environmental studies. This initiative underscores the laboratory's commitment to fostering innovation and improving scientific research capabilities, with a target installation and acceptance date set for early March 2025. Interested vendors must submit their proposals by September 20, 2024, and direct any inquiries to Jenna Doria-Garner at jdoria@anl.gov or by phone at 630-252-6988.

    Point(s) of Contact
    Jenna Doria-Garner
    (630) 252-6988
    jdoria@anl.gov
    Files
    Title
    Posted
    ANL-70 Request for Quotation - SAM.doc
    The document is a Request for Quotation (RFQ) issued by UChicago Argonne, LLC for the provision of materials and services related to a Field-Emission Scanning Electron Microscope (FE-SEM) system. The RFQ outlines various requirements, including the necessity for firm pricing, details on shipping, and compliance with attached terms and conditions. The submission deadline for quotations is September 20, 2024, with all inquiries directed to Jenna Doria. The specifications include the supply of the FE-SEM system, its installation, training, an extended warranty, and potential trade-in discounts for an existing Nova 600 system. Additionally, the RFQ emphasizes adherence to applicable regulations concerning on-site work and disposal of debris. The submission must comply with specific documentation and stipulate lead times and country of origin for the products offered. This RFQ is indicative of the federal government's stringent procurement process, focusing on transparent and competitive bidding to facilitate the acquisition of scientific equipment at Argonne National Laboratory.
    Appendix A-71COM-13-FEB-2023.PDF
    On-Site Work (Moderate)-01-SEP-2023.PDF
    Reps and Certs PD-159.doc.doc
    The document outlines pre-award information necessary for contractors engaging with the federal government under the System for Award Management (SAM). It highlights essential requirements, including the submission of an authorized signature, business identification (UEI, DUNS numbers, and TIN), and the representation of the organization’s status (small business, non-profit, etc.). The document covers compliance areas such as radiation safety, data protection, executive compensation reporting, and certifications regarding the use of suspect or counterfeit parts. It emphasizes cost accounting standards for contracts exceeding specified thresholds and details provisions related to patent waivers under federal laws. Additionally, it addresses the Buy American Act, mandating that each end product must be a domestic product unless otherwise specified. Contractors must confirm adherence to numerous terms and certifications to ensure fair and legal performance under federal contracts, highlighting the importance of transparency and accountability in federal procurement processes. The structure of the document is systematic and includes sections dedicated to various legal and operational requirements every contractor must fulfill before contract award.
    SEM-SOW.docx.docx
    Argonne National Laboratory has issued a Request for Proposals (RFP) for a Field-Emission Scanning Electron Microscope (FE-SEM) to enhance its Center for Nanoscale Materials (CNM). This cutting-edge microscope will significantly improve the characterization of nanoscale materials involved in various research areas crucial to energy, materials, and environmental studies. The primary objectives include manufacturing, testing, delivering, and installing the FE-SEM system at Argonne, with a focus on its advanced capabilities for high-resolution imaging and flexible operation for diverse material types. Critical requirements detail specifications on resolution, magnification, electron sources, detectors, and computer control systems, emphasizing the need for user-friendly and efficient operation. The contractor will also provide training for CNM staff, ensuring thorough familiarization with the system. The project aims for installation and acceptance by early March 2025, underscoring the commitment to research advancement in nanoscale materials characterization. Overall, this initiative highlights the government’s focus on fostering innovation and scientific research capabilities within national laboratories.
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    Field-Emission Scanning Electron Microscope (FE-SEM)
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