Field-Emission Scanning Electron Microscope (FE-SEM)
ID: 4-B175-Q-00761-00Type: Solicitation
Overview

Buyer

ENERGY, DEPARTMENT OFENERGY, DEPARTMENT OFARGONNE NATL LAB - DOE CONTRACTORLemont, IL, 60439, USA

NAICS

Other Professional Equipment and Supplies Merchant Wholesalers (423490)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/41984e85609e47368231dd24627035b2/view
Timeline
    Description

    The Department of Energy, through Argonne National Laboratory, is seeking proposals for the procurement of one Field-Emission Scanning Electron Microscope (FE-SEM), which includes installation, training, warranty, and potential trade-in options for an existing system. This advanced microscope is critical for enhancing research capabilities in nanomaterials, allowing for high-resolution imaging and characterization essential for scientific advancements. Interested vendors must submit their proposals by September 30, 2024, and direct all inquiries to Jenna Doria-Garner at jdoria@anl.gov or by phone at 630-252-6988. Additionally, all clarification questions must be submitted by September 17, 2024, to ensure compliance with the detailed specifications outlined in the Statement of Work.

    Point(s) of Contact
    Jenna Doria-Garner
    (630) 252-6988
    jdoria@anl.gov
    Files
    Title
    Posted
    Addendum 0001.doc
    The document is an addendum to Request for Quotation (RFQ) No. 4-B175-Q-00761-00 issued by Argonne National Laboratory, managed by the U.S. Department of Energy. Its primary purpose is to inform offerors about modifications regarding the proposal process for an unspecified project. Key updates include the provision of an updated Statement of Work (SOW) and an extension of the proposal submission deadline to September 30, 2024. Offerors are required to acknowledge receipt of this addendum by signing and returning it via email. The communication is underscored by the formal invitation to potential offerors to adapt their proposals to reflected changes, ensuring all submissions are aligned with the updated requirements. The addendum underscores the importance of proper protocol in procurement and ensures that all parties are aware of the necessary adjustments to the RFQ process.
    ANL-70 Request for Quotation - SAM.doc
    The document is a Request for Quotation (RFQ) issued by UChicago Argonne, LLC for the provision of materials and services related to a Field-Emission Scanning Electron Microscope (FE-SEM) system. The RFQ outlines various requirements, including the necessity for firm pricing, details on shipping, and compliance with attached terms and conditions. The submission deadline for quotations is September 20, 2024, with all inquiries directed to Jenna Doria. The specifications include the supply of the FE-SEM system, its installation, training, an extended warranty, and potential trade-in discounts for an existing Nova 600 system. Additionally, the RFQ emphasizes adherence to applicable regulations concerning on-site work and disposal of debris. The submission must comply with specific documentation and stipulate lead times and country of origin for the products offered. This RFQ is indicative of the federal government's stringent procurement process, focusing on transparent and competitive bidding to facilitate the acquisition of scientific equipment at Argonne National Laboratory.
    Appendix A-71COM-13-FEB-2023.PDF
    On-Site Work (Moderate)-01-SEP-2023.PDF
    Reps and Certs PD-159.doc.doc
    The document outlines pre-award information necessary for contractors engaging with the federal government under the System for Award Management (SAM). It highlights essential requirements, including the submission of an authorized signature, business identification (UEI, DUNS numbers, and TIN), and the representation of the organization’s status (small business, non-profit, etc.). The document covers compliance areas such as radiation safety, data protection, executive compensation reporting, and certifications regarding the use of suspect or counterfeit parts. It emphasizes cost accounting standards for contracts exceeding specified thresholds and details provisions related to patent waivers under federal laws. Additionally, it addresses the Buy American Act, mandating that each end product must be a domestic product unless otherwise specified. Contractors must confirm adherence to numerous terms and certifications to ensure fair and legal performance under federal contracts, highlighting the importance of transparency and accountability in federal procurement processes. The structure of the document is systematic and includes sections dedicated to various legal and operational requirements every contractor must fulfill before contract award.
    SEM-SOW.docx.docx
    Argonne National Laboratory has issued a Request for Proposals (RFP) for a Field-Emission Scanning Electron Microscope (FE-SEM) to enhance its Center for Nanoscale Materials (CNM). This cutting-edge microscope will significantly improve the characterization of nanoscale materials involved in various research areas crucial to energy, materials, and environmental studies. The primary objectives include manufacturing, testing, delivering, and installing the FE-SEM system at Argonne, with a focus on its advanced capabilities for high-resolution imaging and flexible operation for diverse material types. Critical requirements detail specifications on resolution, magnification, electron sources, detectors, and computer control systems, emphasizing the need for user-friendly and efficient operation. The contractor will also provide training for CNM staff, ensuring thorough familiarization with the system. The project aims for installation and acceptance by early March 2025, underscoring the commitment to research advancement in nanoscale materials characterization. Overall, this initiative highlights the government’s focus on fostering innovation and scientific research capabilities within national laboratories.
    SEM-SOW Version 2.docx
    The Argonne National Laboratory (ANL) has issued a Statement of Work for procuring a Field-Emission Scanning Electron Microscope (FE-SEM) for its Center for Nanoscale Materials (CNM). This advanced microscope will enhance research capabilities in nanomaterials, allowing for high-resolution imaging, dimensional property assessment, and nanopattern characterization across diverse substrates. The contractor is tasked with manufacturing and delivering a state-of-the-art FE-SEM system by September 3, 2025, ensuring it meets rigorous specifications for performance, flexibility, and reliability, including a resolution of 0.9 nm and a magnification range of up to 1,000,000X. The procurement requires the vendor to provide installation, user training, and ongoing maintenance support, with guarantees for a minimum of 85% operational uptime. The contract emphasizes quality assurance, adherence to safety standards, and comprehensive documentation throughout the project. Following installation, rigorous factory and site testing will validate compliance with technical specifications. Successful bidders will also supply detailed reports on testing outcomes and operational documentation to ensure proper system integration and user readiness, marking a commitment to advancing nanoscale research at ANL.
    Lifecycle
    Title
    Type
    Field-Emission Scanning Electron Microscope (FE-SEM)
    Currently viewing
    Solicitation
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