Sources Sought: Piezoresponse Force Microscopy Module
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information on vendors that can provide a Piezoresponse Force Microscopy Module. This module is an accessory to the MFP-3D atomic force microscope and is used for characterizing dielectric breakdown with nanoscale precision. It allows for the application of constant or ramped biases up to ±220 V while monitoring the current through a conductive AFM probe.
The purpose of this notice is to identify organizations capable of providing the necessary module and meeting the minimum contractor qualifications. Interested business organizations should submit electronic copies of their capability statement, including information such as the company name, country of origin or place of performance of product manufacturing, business status, spec sheets and examples of products that meet the specifications, typical lead time for product delivery, and any other relevant information.
Please note that this announcement is not a Request for Proposals or Quote (RFP/RFQ) and does not commit the Government to award a contract at this time. After analyzing the results of this market research, NIST may conduct a competitive or non-competitive procurement and subsequently award a contract. The NAICS code assigned to this requirement is 334516, Analytical Laboratory Instrument Manufacturing, with a small business size standard of 1,000 employees.
Interested vendors should submit their capability statement to Lisa Stevens, the Contract Specialist, via email at lisa.stevens@nist.gov by 11:00 a.m. MT on July 22, 2024. No quotes will be accepted at this time.
For more specific details and requirements, please refer to the attached Statement of Work document.