Video Rate Electrochemical Scanning Tunneling Microscopy Combined Sources Sought/ Notice of Intent to Sole Source
ID: NIST-SS25-CHIPS-0045Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)
Timeline
  1. 1
    Posted Jan 15, 2025, 12:00 AM UTC
  2. 2
    Updated Jan 15, 2025, 12:00 AM UTC
  3. 3
    Due Jan 29, 2025, 4:00 PM UTC
Description

The National Institute of Standards and Technology (NIST) is seeking to procure a video rate electrochemical scanning tunneling microscopy (ECSTM) system to enhance its existing capabilities in studying electrochemical deposition and etching processes relevant to advanced microelectronics fabrication. The procurement aims to upgrade the electronics and control system of the current ECSTM, enabling fast x, y, z waveforms and high-speed imaging capabilities, which are essential for tracking molecular dynamics during metal deposition. Interested vendors must provide a new control system and high voltage unit that meets specific technical specifications, with responses due by November 18, 2024. For inquiries, potential respondents can contact Junee Johnson at junee.johnson@nist.gov.

Point(s) of Contact
Files
No associated files provided.
Lifecycle
Similar Opportunities
Electro-Optic Probe System
Buyer not available
The National Institute of Standards and Technology (NIST) is seeking information from vendors capable of providing an Electro-Optic Probe System as part of a market research initiative. This procurement aims to enhance NIST's capabilities in accurately measuring electromagnetic fields, requiring a system that operates within a frequency range of 1 GHz to 12 GHz and includes components such as an optoelectronic converter, various electro-optic probes, and calibration services. Interested businesses, including small and large firms, are invited to submit capability statements detailing their qualifications, product specifications, and delivery timelines, with responses due by the specified deadline. For further inquiries, vendors can contact Clifford Nicholson at clifford.nicholson@nist.gov or Daniel Kent at daniel.kent@nist.gov.
Camera for Vacuum- and Extreme-Ultraviolet light
Buyer not available
The Department of Commerce, through the National Institute of Standards and Technology (NIST), is seeking information from vendors regarding the procurement of a specialized camera designed for vacuum- and extreme-ultraviolet (EUV) light applications. This camera is essential for advancing metrology techniques that enhance semiconductor manufacturing, requiring capabilities such as operation in ultra-high vacuum environments and sensitivity to wavelengths ranging from 10 nm to 150 nm for non-destructive measurement of nanoscale features. Interested vendors are invited to submit their company details, product specifications, performance capabilities, and any customization options, as this Sources Sought Notice (NIST-FY25-CHIPS-0081) is part of NIST's market research and does not imply a solicitation or contract commitment. For further inquiries, vendors may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Tracy Retterer at Tracy.retterer@nist.gov.
Galvanometer Scanner System
Buyer not available
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a galvanometer scanner system to enhance its research in metals-based additive manufacturing (AM). The procurement aims to upgrade the Fundamentals of Laser-Matter Interaction (FLaMI) testbed by integrating it with a Scanlabs Galvo Scanner, specifically the ExcelliSCAN20 model, to improve AM process monitoring capabilities. This initiative is crucial for advancing measurement science and ensuring rapid design-to-product transformation in AM technologies. Interested vendors should respond to Hunter Tjugum at hunter.tjugum@nist.gov by email, providing detailed information about their capabilities and relevant products, with responses due within 7 business days of the notice issuance.
Confocal Raman Mcroscope
Buyer not available
The Department of Commerce's National Institute of Standards and Technology (NIST) is seeking quotations for the procurement of a Confocal Raman Microscope, specifically the Horiba LabRAM Odyssey or an equivalent model. This advanced laboratory equipment is intended to enhance research capabilities in semiconductor manufacturing processes, particularly in support of the CHIPS Act Grand Challenge 5, by facilitating in-depth analysis of electrochemical processes crucial for optimized semiconductor design and packaging. Interested vendors must comply with FAR regulations, provide detailed specifications and pricing, and demonstrate relevant experience, with proposals due by April 18, 2025. For further inquiries, vendors can contact Junee Johnson at junee.johnson@nist.gov.
High Vacuum Motorized Stages
Buyer not available
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential vendors regarding high vacuum motorized stages to enhance the capabilities of its Nanoscale Device Characterization Division (NDCD). These motorized stages are critical for characterizing engineered materials using extreme-ultraviolet (EUV) techniques, focusing on non-destructive measurements that support the semiconductor industry. The procurement emphasizes the need for multiple axes of motion control, including continuous 360° rotation and six axes of positioning, along with compatibility with high vacuum systems and specific performance specifications. Interested vendors should provide detailed technical specifications and insights into their products, with responses directed to Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Tracy Retterer at Tracy.retterer@nist.gov, as part of this sources sought notice.
Sampler Holder for TEM
Buyer not available
The National Institute of Standards and Technology (NIST) is seeking proposals for a Heating-Biasing Sample Holder compatible with their Thermo Fisher scanning transmission electron microscopy (S)TEM, as outlined in solicitation number NB686090-25-01357. This specialized equipment is crucial for conducting in-situ analyses of semiconductor devices under varying conditions, including temperatures up to 900 °C and bias voltages from 0 V to 40 V, thereby enhancing the lab's capabilities in measuring atomic-scale failure mechanisms. Interested vendors must submit detailed quotations that demonstrate their technical capabilities, relevant experience, and pricing, with a focus on compliance with federal procurement standards. For inquiries, contact Angela Hitt at angela.hitt@nist.gov or 303-497-7305, and ensure submissions are made electronically by the specified deadline.
Oscilloscope
Buyer not available
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking quotations for the procurement of a high-speed real-time oscilloscope under solicitation number NB686000-25-01012. This oscilloscope is critical for conducting precise measurements of superconducting circuit performance, which is essential for advancing research in applied physics and technology. Key specifications include a minimum 20 GHz analog bandwidth, four channels, a maximum sampling rate of 128 GSa/s, and stringent requirements for vertical resolution and inter-channel jitter. Interested vendors must submit their proposals, including firm fixed pricing and technical capability documentation, by adhering to the guidelines outlined in the RFQ, with a delivery timeline of no longer than eight weeks after receipt of order. For further inquiries, potential contractors can contact Angela Hitt at angela.hitt@nist.gov or by phone at 303-497-7305.
Large aperture high-vacuum compatible rotary stage
Buyer not available
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a large aperture high-vacuum compatible rotary stage to enhance its measurement capabilities in nanoscale device characterization. The rotary stage must meet specific requirements, including the ability to rotate a mass greater than 3 kg along a 135° arc, accommodate a clear aperture of at least 135 mm, and operate within a vacuum chamber at pressures below 10^-6 Torr. This equipment is crucial for non-destructive measurements of nanoscale patterned features, supporting advancements in the American semiconductor industry. Interested vendors should respond to the primary contact, Elizabeth Timberlake, at elizabeth.timberlake@nist.gov, providing detailed information about their capabilities and products by the specified deadline, as this notice is part of market research and does not constitute a solicitation.
Sources Sought Notice for Fully-Automated 360 Degree 3D Scanning System
Buyer not available
The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential suppliers for a fully automated 360-degree 3D scanning system. This advanced technology is intended to facilitate the analysis of firebrand samples from wildland urban interface fire experiments without requiring user intervention, ensuring high precision and volumetric accuracy of at least 10 μm while processing multiple small objects simultaneously. The contractor will be responsible for delivering the system, including installation, training for up to four users, and warranty services, with responses required to detail product specifications, customization options, and compliance with U.S. manufacturing standards. Interested vendors should contact Marvin Jean at marvin.jean@nist.gov for further information, as this sources sought notice is part of NIST's market research and does not commit to a contract or solicit bids.
Optical Frequency Domain Reflectometer
Buyer not available
The National Institute of Standards and Technology (NIST) is seeking information from potential suppliers for an Optical Frequency Domain Reflectometer to support its CHIPS Metrology Program, which aims to enhance measurement science in semiconductor manufacturing. The required system must cover telecommunications C and L bands, providing high spatial resolution and dynamic range for analyzing back reflection and transmission signals from photonic integrated circuit components. This procurement is critical for advancing R&D in microelectronics and ensuring the competitiveness of the U.S. semiconductor industry. Interested parties should respond to Junee Johnson at junee.johnson@nist.gov with their capabilities and relevant product information, as this notice is for market research purposes and does not constitute a solicitation.