Optical Frequency Domain Reflectometer

The National Institute of Standards and Technology (NIST) is seeking information from potential suppliers for an Optical Frequency Domain Reflectometer to support its CHIPS Metrology Program, which aims to enhance measurement science in semiconductor manufacturing. The required system must cover telecommunications C and L bands, providing high spatial resolution and dynamic range for analyzing back reflection and transmission signals from photonic integrated circuit components. This procurement is critical for advancing R&D in microelectronics and ensuring the competitiveness of the U.S. semiconductor industry. Interested parties should respond to Junee Johnson at junee.johnson@nist.gov with their capabilities and relevant product information, as this notice is for market research purposes and does not constitute a solicitation.