Sources Sought DEPT OF DEFENSE DEPT OF THE NAVY is seeking a Rigaku XtaLAB Synergy-S Single Crystal X-Ray Diffractometer. This equipment is typically used for analyzing the structure of single crystals by measuring the diffraction pattern produced when X-rays interact with the crystal lattice. The procurement includes specific components such as X-ray sources, a goniometer, a photon counting detector, software, a low-temperature system, and warranty. Interested firms must submit a capability statement within 10 days. Registration in the System for Award Management (SAM) is required.