TEM Sample Holder/Scanning Electron Microscopy Stage w/HF capabilities
Contract Opportunity Analysis
The Department of Energy, specifically the Brookhaven National Laboratory, is seeking sources for the procurement of a specialized transmission electron microscope (TEM) sample holder and a scanning electron microscopy (SEM) stage with high-frequency capabilities. The TEM holder must accommodate thin research samples, apply electric bias, and operate at variable temperatures from liquid nitrogen (~100 K) to 800 °C, while the SEM stage is designed for high-frequency biasing experiments and features a flippable head stage for versatile usage. This procurement is crucial for enhancing experimental capabilities in advanced materials research, aligning with federal funding initiatives that support innovative scientific instruments. Interested parties should submit their capabilities statements and SAM.gov UEI numbers to Eric Nagel at enagel@bnl.gov, as a formal Request for Quotation (RFQ) will be issued following this sources sought notice.