The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), intends to negotiate a sole source contract with AMAG Consulting, LLC for the procurement of one 300 mm silicon wafer with copper damascene patterns. This wafer is essential for advancing NIST's CHIPS mission, particularly in developing imaging and measurement solutions for integrated circuit overlay metrology using a scanning electron microscope. The project requires specific overlay metrology parameters and documentation, with the sole source determination based on AMAG Consulting's unique capability to provide the required wafer without the need for a photomask. Interested parties must submit their capabilities in writing by 11:00 a.m. EST on January 29, 2025, to either Jenna Bortner or Ranae M. Armstrong via email.