Advanced Metrology for Future Microelectronics
ID: 2Type: BOTH
Overview

Topic

Advanced Metrology for Future Microelectronics

Agency

Department of CommerceNational Institute of Standards and Technology

Program

Type: SBIRPhase: BOTHYear: 2024

Topic Link

https://www.sbir.gov/node/2609705

Additional Information

https://grants.gov/search-results-detail/353574
Timeline
  1. 1
    Release Apr 16, 2024 12:00 AM
  2. 2
    Open Apr 16, 2024 12:00 AM
  3. 3
    Next Submission Due Jun 14, 2024 12:00 AM
  4. 4
    Close Jun 14, 2024 12:00 AM
Description

The Department of Commerce, specifically the National Institute of Standards and Technology, is seeking proposals for the FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology. The topic of the solicitation is "Advanced Metrology for Future Microelectronics".

This solicitation is open to both Phase I and Phase II proposals. The project duration is not specified in the document. The funding specifics are not provided in the document.

The research topic focuses on advanced metrology for future microelectronics. The solicitation aims to support research and development in the field of metrology to address the challenges and advancements in microelectronics. The technology or research being solicited is expected to have applications in the field of microelectronics and contribute to the advancement of the industry.

For more information and to submit proposals, interested parties can visit the SBIR topic link provided: SBIR Topic Link. The solicitation notice can be found on the grants.gov website: Solicitation Agency URL.

The solicitation is currently open, with a release date of April 16, 2024, and a closing date of June 14, 2024.

Files
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