Sources Sought Notice for Coupled Device Detector Camera System
ID: NIST-SS26-CHIPS-25Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/f4a5be04887743bd8d0ed670af882a0f/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding a Coupled Device Detector Camera System through a sources sought notice (NIST-SS26-CHIPS-25). This procurement aims to support the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project, which focuses on enhancing plasma etching efficiencies via in situ optical diagnostics. The required system includes an intensified electron multiplication charge coupled device (IEMCCD) camera with specific technical specifications, including ultra-low noise, high gain, and fast optical emission spectroscopy capabilities. Interested parties should provide detailed company information, product specifications, and performance capabilities, and may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.

    Point(s) of Contact
    Elizabeth Timberlake
    elizabeth.timberlake@nist.gov
    Donald Collie
    donald.collie@nist.gov
    Files
    Title
    Posted
    Sources Sought Notice.docx
    NIST has issued a sources sought notice, NIST-SS26-CHIPS-25, to conduct market research for a Coupled Device Detector Camera System. This system is crucial for the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project (5.04), aimed at improving plasma etching efficiencies through in situ optical diagnostics. The project requires an intensified electron multiplication charge coupled device (IEMCCD) camera with ultra-low noise, high gain, and an integrated intensifier, capable of fast optical emission spectroscopy (OES) measurements at 13.56 MHz. Essential technical specifications for the camera include a back-illuminated EMCCD sensor, 18mm or larger Gen III intensifier with 1 nanosecond or less gating time, specific quantum efficiencies, and various noise and cooling requirements. The solicitation also specifies software requirements for camera control, data acquisition, and analysis compatible with 64-bit Windows 10. Respondents are asked to provide company information, product technical specifications, performance capabilities, manufacturing details, NAICS code information, available services, standard terms, pricing, and customer references.
    Lifecycle
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    Sources Sought Notice for Coupled Device Detector Camera System
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