The Department of Energy is offering a licensing opportunity for an innovative system and method designed for artifact reduction in computed tomography (CT) reconstruction, leveraging artificial intelligence and a priori known models for the object of interest. This technology, known as Simurgh, developed by Oak Ridge National Laboratory (ORNL), aims to enhance the speed and accuracy of nondestructive testing in various industries, including aerospace, automotive, biomedical, and energy, by significantly improving defect detection capabilities and reducing operational costs. Simurgh delivers scan times 12 to 20 times faster than traditional methods and can identify flaws as small as 50 µm–100 µm, making it a versatile solution for high-throughput evaluation in Industry 4.0 applications. Interested parties can learn more about this technology by contacting Eugene R. Cochran at cochraner@ornl.gov or by calling 865-576-2830.