The Department of Energy, specifically through ORNL UT-Battelle LLC, is offering a licensing opportunity for a wavefront distortion correction algorithm designed for scanning tunneling microscopy (STM) images. This innovative technology addresses the common issue of distortion in STM images by providing a method to identify and correct nonlinear in-plane distortions without prior knowledge of scanning parameters or atom positions. The algorithm is particularly beneficial for manufacturers and users of scanning tunneling and electron microscopes, as it enhances the accuracy of atomic resolution imaging. Interested parties can learn more about this technology by contacting Leslie Smith at smithlm@ornl.gov or by phone at 865-341-0373.