The Department of Energy, through ORNL UT-Battelle LLC, is offering a licensing opportunity for a groundbreaking technology that enables real-time, rapid, and non-invasive atomic lock-on in scanning transmission electron microscopes (STEM). This innovative procedure allows for ultra-precise targeting of individual atoms with a precision below 20 picometers, significantly enhancing the capabilities of STEM by automating beam experiments and minimizing human error. The technology is particularly relevant for applications in semiconductor manufacturing and materials research, providing benefits such as non-invasiveness, speed, and high precision. Interested parties can learn more about this opportunity by contacting partnerships@ornl.gov or calling 865-574-1051.