The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a super high-resolution darkfield scattering-confocal Raman microscope to enhance its capabilities in detecting and identifying nanoparticle contaminants at extremely low concentrations. The procurement aims to address significant challenges in measuring baseline impurities below 1 part per trillion (PPT) during integrated chip fabrication, utilizing advanced optical microscopy techniques to achieve high sensitivity and speed in particle detection. Interested vendors must respond with detailed information about their capabilities and products that meet the specified requirements, including technical specifications and potential customization options, by contacting Jenna Bortner at jenna.bortner@nist.gov or Donald Collie at donald.collie@nist.gov. This notice serves as a sources sought announcement and does not constitute a commitment to award a contract.