The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for the ETEM Post-Column Electron Energy-Loss Spectrometer Upgrade, aimed at enhancing measurement capabilities in semiconductor materials. The upgrade involves retrofitting existing cameras to improve electron energy-loss spectroscopy (EELS) and high-resolution transmission electron microscopy (HRTEM) measurements, which are critical for addressing challenges in the semiconductor supply chain. This initiative is vital for advancing metrology in chip manufacturing, particularly for complex compound semiconductors. Interested parties should contact Junee Johnson at junee.johnson@nist.gov for further details, and responses are encouraged before the closing date of April 14, 2025.