Purchase of Field emission scanning electron micro
ID: 68HERH25Q0056Type: Solicitation
Overview

Buyer

ENVIRONMENTAL PROTECTION AGENCYENVIRONMENTAL PROTECTION AGENCYHEADQUARTERS ACQUISITION DIV (HQAD)WASHINGTON, DC, 20460, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/4fc1ae379ef44ce7b875791a81286d7d/view
Timeline
    Description

    The Environmental Protection Agency (EPA) is seeking to procure a field emission scanning electron microscope (SEM) for its National Enforcement Investigations Center (NEIC). This advanced analytical instrument is essential for conducting high-resolution imaging and analysis of materials, which plays a critical role in environmental investigations and enforcement activities. Interested vendors should note that the procurement falls under the NAICS code 334516, and inquiries can be directed to Sohyun Hahn at hahn.sohyun@epa.gov or by phone at 202-564-3663. Further details regarding the solicitation process and deadlines will be provided in the official solicitation documents.

    Point(s) of Contact
    Hahn, Sohyun
    (202) 564-3663
    hahn.sohyun@epa.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Purchase of Field emission scanning electron micro
    Currently viewing
    Solicitation
    Similar Opportunities
    J--Notice of Intent to Sole Source - AB Sciex LLC
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) has issued a Notice of Intent to Sole Source for a Service Maintenance Agreement for the Sciex System X500R and associated nitrogen generator. This procurement aims to ensure the continued operational efficiency and reliability of critical laboratory equipment used in environmental analysis and research. The maintenance services are essential for the upkeep of instruments that play a vital role in the EPA's mission to protect human health and the environment. Interested parties can reach out to Pam Daggs at Daggs.Pam@epa.gov or call 580-436-8511 for further details regarding this opportunity.
    J--Notice of Intent to Sole Source
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) has announced a Notice of Intent to Sole Source for a Basic Preventative Maintenance Program for the VIAFLO 96/384 equipment. This procurement aims to ensure the ongoing maintenance and operational efficiency of critical electronic and precision equipment, which is vital for laboratory functions and environmental monitoring. The contract will focus on the maintenance and repair of instruments and laboratory equipment, categorized under NAICS code 811210 and PSC code J066. Interested parties can reach out to Pam Daggs at Daggs.Pam@epa.gov or call 580-436-8511 for further details regarding this opportunity.
    PD-33-0012; Scanning Electron Microscope (SEM)
    Dept Of Defense
    The Department of Defense, through the Naval Surface Warfare Center, Philadelphia Division (NSWCPD), is seeking to procure one (1) Scanning Electron Microscope (SEM) to support its Machinery Research, Logistics & Ship Integrity Department. The SEM must meet specific technical requirements, including a Schottky Emitter, SE and BSE detectors, a chamber for 300mm specimens, and an integrated EDS system, with functional capabilities such as <3nm resolution at 1kV and variable pressure capabilities (10-150 Pa). This procurement is critical for metallographic analysis and imaging, and interested businesses are invited to submit a 5-page Capability Statement by December 23, 2025, to demonstrate their ability to meet these requirements. Responses should be sent electronically to Jenny Tomeo at jenny.e.tomeo.civ@us.navy.mil, and the anticipated contract type is Firm Fixed-Price under Simplified Acquisition Procedures, with a Request for Proposal expected in February 2026.
    F--Superfund Analytical Methods Provisions & Clauses
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) is seeking analytical services through the Superfund Analytical Methods (SFAM02.0) Solicitation to support its investigation and cleanup activities under the Comprehensive Environmental Response, Compensation, and Liability Act of 1980 (CERCLA) and the Superfund Amendments and Reauthorization Act of 1986 (SARA). The procurement aims to provide essential analytical data that will assist the EPA in effectively managing environmental remediation efforts. This opportunity is critical for ensuring compliance with federal environmental regulations and facilitating the cleanup of contaminated sites. Interested parties can reach out to Mary K. Doherty at doherty.mary@epa.gov or (202) 564-8951 for further information regarding the solicitation and associated provisions.
    Sole Source Justification Field Emission Scanning Electron Microscope (FESEM)
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Sole Source Field Emission Scanning Electron Microscope (FESEM) through a Justification for Other Than Full and Open Competition (JOFOC). This procurement is essential for advancing NIST's capabilities in laboratory equipment and supplies, particularly in high-resolution imaging and analysis. The justification for this sole source acquisition will be publicly available within 14 days of the contract award, and the opportunity will remain open for 30 days in accordance with federal regulations. Interested parties can reach out to Nina Lin at nina.lin@nist.gov or Forest Crumpler at forest.crumpler@nist.gov for further inquiries.
    66--NOI to Sole Source for Mesacare On-Prem Plan
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) is seeking to procure a Sole Source requirement for a premium service plan related to calibration and maintenance services for the R6 Houston Lab. This procurement involves a Request for Quote (RFQ) for a Purchase Order (PO) aimed at ensuring the proper functioning of instruments used for measuring, displaying, and controlling industrial process variables. The services are critical for maintaining the accuracy and reliability of pressure, temperature, and humidity measuring instruments, which are essential for the lab's operations. Interested vendors can contact Sonja Johnson at johnson.sonja@epa.gov or (214) 665-7469 for further details regarding this opportunity.
    Request for Information Sources Sought Notice
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) is issuing a Request for Information Sources Sought Notice to identify potential sources for facilities support services under NAICS code 561210. This notice aims to gather information from interested parties regarding their capabilities to provide housekeeping and interior plantscaping services, which are essential for maintaining a clean and functional environment within EPA facilities. Interested vendors are encouraged to reach out to Eric Mohollen at the EPA's Region 3 Contracting Office via email at mohollen.eric@epa.gov or by phone at (215) 814-5315 for further details. This is a preliminary notice and does not constitute a solicitation for proposals.
    Phenom XL G3 SEM or equivalent
    Energy, Department Of
    The Department of Energy, through UT-Battelle LLC, is seeking proposals for the procurement of a Phenom XL G3 Scanning Electron Microscope (SEM) or an equivalent domestic model. This equipment is essential for the Enrichment Science and Engineering Division, which requires advanced microscopy capabilities for analytical purposes, including high magnification and elemental analysis. Proposals must be submitted by December 18, 2025, with a focus on the lowest priced, technically acceptable offer, and interested parties should direct inquiries to Brittany Waring at waringbc@ornl.gov. The procurement is not set aside for small businesses, and the NAICS code for this opportunity is 334516.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Commerce, Department Of
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    B--EPA Region 7: Environmental Services Assistance Team (ESAT)
    Environmental Protection Agency
    The Environmental Protection Agency (EPA) is seeking proposals for the Environmental Services Assistance Team (ESAT) in Region 7, which will provide essential environmental services. The procurement aims to support various environmental testing and analysis activities, focusing on chemical and biological assessments as outlined under NAICS code 541380 and PSC code B504. These services are critical for ensuring compliance with environmental regulations and enhancing public health and safety in the region. Interested vendors can reach out to Frank Novello at Novello.Frank@epa.gov or by phone at (913) 551-7642 for further details regarding the presolicitation notice.