USAFA Scanning Electron Microscope
ID: FA700025Q0058Type: Combined Synopsis/Solicitation
Overview

Buyer

DEPT OF DEFENSEDEPT OF THE AIR FORCEFA7000 10 CONS LGCUSAF ACADEMY, CO, 80840-2303, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/0c23c65625a34e22b4bc13f6748ad8a0/view
Timeline
    Description

    The Department of Defense, through the U.S. Air Force Academy, is seeking proposals for the procurement of a Scanning Electron Microscope (SEM) along with a four-year sustainment and maintenance plan. The SEM must meet specific technical requirements, including advanced resolution performance, operational modes, and detector capabilities, to support research initiatives at the Academy. This procurement is critical for enhancing scientific and engineering analysis capabilities, adhering to the Buy American Statute, and ensuring compliance with federal acquisition regulations. Interested vendors must submit their quotes by July 21, 2025, and ensure they have an active SAM registration; for further inquiries, they can contact Ronald Wilson at ronald.wilson.26@us.af.mil or Brianna Morphis at brianna.morphis@us.af.mil.

    Point(s) of Contact
    Ronald Wilson
    ronald.wilson.26@us.af.mil
    Brianna Morphis
    brianna.morphis@us.af.mil
    Files
    Title
    Posted
    Attachment 1-Salient Characteristics.pdf
    The document outlines the technical specifications and requirements for a Scanning Electron Microscope (SEM) with Energy Dispersive Spectroscopy (EDS) capabilities, intended for procurement through government RFPs. Essential features include a Schottky-type Field Emission Gun, specific resolution standards in both High Vacuum (HV) and Low Vacuum (LV) modes, and a wide operational voltage range. The microscope must possess comprehensive probe current and magnification capabilities, alongside a motorized, versatile five-axis stage. Integral to the system are advanced detectors, including a Secondary Electron detector and a Silicon Drift Detector for EDS, which enable detailed elemental mapping and imaging. Software provisions require automated optimization and high digital image resolution while supporting large area imaging. The system needs to operate on standard utilities and include necessary training, installation services by trained personnel, and a minimum one-year warranty. Overall, this document serves as a formal request for proposals to acquire sophisticated microscopy equipment critical for research and analysis in various scientific and engineering domains.
    Attachment 2-Provisions and Clauses.pdf
    The document appears to be a protected PDF file related to federal and state RFPs (Requests for Proposals) and grants; however, its content cannot be accessed or summarized due to the protection. Generally, such documents typically provide guidance on the application processes, eligibility criteria, funding opportunities, and specific requirements for federal and state agencies seeking proposals from contractors or organizations. They often outline project goals, objectives, and expected deliverables, alongside compliance standards that applicants must fulfill to qualify for funding or contracts. Without the ability to view the details, I cannot present a specific summary of this document's content or its relevance to government grants and RFPs. Nonetheless, it is important for stakeholders to understand that these documents often aim to promote transparency, encourage competitive bidding, and ensure that funding aligns with governmental priorities and regulatory frameworks.
    Attachment 3-Trade Agreement Certificate.pdf
    The Trade Agreements Certificate outlines provisions for federal procurement, specifically regarding the eligibility of end products based on their country of origin. It defines key terms such as "U.S.-made end product" and "designated country end product". The federal government will evaluate offers according to specific Defense Federal Acquisition Regulation guidelines, prioritizing U.S.-made and qualifying country products. There are exceptions where non-designated country products may be considered, including situations where no eligible offers are available or if a national interest waiver has been granted. Offerors are required to certify the origin of the products being delivered under the contract, documenting any nondesignated country products separately. This certification process ensures compliance with trade agreements in government contracts, ultimately supporting fair trade practices. Overall, the certificate serves as a critical mechanism for maintaining appropriate sourcing standards in federal acquisitions.
    Combined Synopsis Solicitation_Scanning Electron Microscope.pdf
    The U.S. Air Force Academy has issued a combined synopsis/solicitation (FA700025Q0058) for a Scanning Electron Microscope (SEM) and a four-year sustainment and maintenance plan. This request for quotation (RFQ) follows Federal Acquisition Regulations (FAR) guidelines, seeking to acquire a domestic SEM that meets specified technical requirements, such as resolution performance, operational modes, and detector capabilities. The procurement aims to support research within the Academy, highlighting adherence to the Buy American Statute. Quoters are advised that no awards will be made unless funds are available and are responsible for their proposal costs. They must submit quotes by the deadline of July 21, 2025, detailing pricing, delivery timelines, and compliance with various federal regulations. All quotes will be evaluated based on price and technical criteria. The document underscores the importance of compliance with federal guidelines and the necessity for potential vendors to have an active SAM registration. Furthermore, it clarifies that proposals must not include refurbished or gray market items, ensuring only new products are considered for procurement. This solicitation reflects standard practices in federal contracting, focusing on transparency and value for the government.
    Lifecycle
    Title
    Type
    USAFA Scanning Electron Microscope
    Currently viewing
    Combined Synopsis/Solicitation
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